中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A Study on The Assembly and Improvement of Electrical Contact Between Carbon Nanotube and Microelectrode

文献类型:会议论文

作者Tian XJ(田孝军); Wang YC(王越超); Dong ZL(董再励)
出版日期2008
会议名称1st International Conference Society of Micro/Nano Technology, CSMNT
会议日期November 19-22, 2008
会议地点Beijing, China
关键词Assembly Improvement of electrical contact Carbon nanotube (CNT) Pulse gas alignment Nanomanipulation based on atomic force microscope (AFM) Sweeping voltage
页码399-405
中文摘要Nowadays research on nano-electronic device based on carbon nanotube (CNT) raises much interest among researchers, but in the fabrication process, crucial problems exist in making and improving the electrical contact between CNT and microelectrode. Here pulse gas alignment method, combined with nanomanipulation technology based on atomic force microscope (AFM) if necessary, is proposed for the first time to assemble and make electrical contact between CNT and microelectrode. After the assembly, a processing technique of applying sweeping voltages is performed for producing electrical current induced local Joule heat, which will decompose and remove the sodium dodecyl sulfate (SIDS) molecules adsorbed on the CNT and at the interface region, or even have some annealing effect, to reduce the contact resistance between CNT and microelectrode and thus to improve the electrical contact. Experiments of assembly and improvement of electrical contact between multi-wall carbon nanotube and microelectrode arc performed to verify the effectiveness of the proposed methods.
收录类别EI ; CPCI(ISTP)
产权排序1
会议录Advanced Materials Research
会议录出版者Trans Tech Publications
会议录出版地Clausthal-Zellerfeld, Germany
语种英语
ISSN号1022-6680
ISBN号978-0-87849-339-5
WOS记录号WOS:000265591300082
源URL[http://ir.sia.cn/handle/173321/8524]  
专题沈阳自动化研究所_机器人学研究室
推荐引用方式
GB/T 7714
Tian XJ,Wang YC,Dong ZL. A Study on The Assembly and Improvement of Electrical Contact Between Carbon Nanotube and Microelectrode[C]. 见:1st International Conference Society of Micro/Nano Technology, CSMNT. Beijing, China. November 19-22, 2008.

入库方式: OAI收割

来源:沈阳自动化研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。