中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Comparing ODEP and DEP Forces for Micro/Nano Scale Manipulation: A Theoretical Analysis

文献类型:会议论文

作者Wang SE(王淑娥); Li ML(李明林); Dong ZL(董再励); Qu YL(曲艳丽); Li WJ(李文荣)
出版日期2010
会议名称5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010
会议日期January 20-23, 2010
会议地点Xiamen, China
关键词Electric fields Electrodes Force Laser beams Nanobioscience Optical imaging Optical refraction
页码1174-1179
中文摘要

This paper presents a theoretical investigation to evaluate and compare the capabilities of using dielectrophoresis (DEP) and optical image-driven dielectrophoresis (ODEP) forces for micro/nano scale manipulation. A simplified model of particle velocity as a function of electrode size and particle radius was derived based on Stokes' law. Then, electric field analysis of two typical electrode configurations for DEP and ODEP manipulation was conducted under the same applied AC power and electrode dimension. Our results indicate that compared to DEP, ODEP provides much higher dominant force for micro/nano particle manipulation due to its Gaussian distribution of the light beam. Moreover, with only Brownian effect, theoretical results indicate that the minimum radius of particles that ODEP can manipulate has a close dependence on the virtual electrode size. ODEP can manipulate nano particles down to 2nm when the spot size down to 1μm.

产权排序1
会议录2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010
会议录出版者IEEE Computer Society
会议录出版地Piscataway, NJ
语种英语
ISBN号978-1-4244-6543-9
源URL[http://ir.sia.cn/handle/173321/8604]  
专题沈阳自动化研究所_机器人学研究室
推荐引用方式
GB/T 7714
Wang SE,Li ML,Dong ZL,et al. Comparing ODEP and DEP Forces for Micro/Nano Scale Manipulation: A Theoretical Analysis[C]. 见:5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010. Xiamen, China. January 20-23, 2010.

入库方式: OAI收割

来源:沈阳自动化研究所

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