Comparing ODEP and DEP Forces for Micro/Nano Scale Manipulation: A Theoretical Analysis
文献类型:会议论文
作者 | Wang SE(王淑娥); Li ML(李明林); Dong ZL(董再励)![]() ![]() ![]() |
出版日期 | 2010 |
会议名称 | 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010 |
会议日期 | January 20-23, 2010 |
会议地点 | Xiamen, China |
关键词 | Electric fields Electrodes Force Laser beams Nanobioscience Optical imaging Optical refraction |
页码 | 1174-1179 |
中文摘要 | This paper presents a theoretical investigation to evaluate and compare the capabilities of using dielectrophoresis (DEP) and optical image-driven dielectrophoresis (ODEP) forces for micro/nano scale manipulation. A simplified model of particle velocity as a function of electrode size and particle radius was derived based on Stokes' law. Then, electric field analysis of two typical electrode configurations for DEP and ODEP manipulation was conducted under the same applied AC power and electrode dimension. Our results indicate that compared to DEP, ODEP provides much higher dominant force for micro/nano particle manipulation due to its Gaussian distribution of the light beam. Moreover, with only Brownian effect, theoretical results indicate that the minimum radius of particles that ODEP can manipulate has a close dependence on the virtual electrode size. ODEP can manipulate nano particles down to 2nm when the spot size down to 1μm. |
产权排序 | 1 |
会议录 | 2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010
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会议录出版者 | IEEE Computer Society |
会议录出版地 | Piscataway, NJ |
语种 | 英语 |
ISBN号 | 978-1-4244-6543-9 |
源URL | [http://ir.sia.cn/handle/173321/8604] ![]() |
专题 | 沈阳自动化研究所_机器人学研究室 |
推荐引用方式 GB/T 7714 | Wang SE,Li ML,Dong ZL,et al. Comparing ODEP and DEP Forces for Micro/Nano Scale Manipulation: A Theoretical Analysis[C]. 见:5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010. Xiamen, China. January 20-23, 2010. |
入库方式: OAI收割
来源:沈阳自动化研究所
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