A New Method for Automatic Quality Inspection of Glue-Line
文献类型：会议论文
| 作者 | Chen S(陈帅) ; Lin MX(林明秀)
|
| 出版日期 | 2009 |
| 会议名称 | 2009 International Conference on Information Engineering and Computer Science, ICIECS 2009 |
| 会议日期 | December 19-20, 2009 |
| 会议地点 | Wuhan, China |
| 页码 | 1-3 |
| 中文摘要 | Based on the different brightness feature of the glue-line and gluing surface, we propose a new method to analyze the glue-line with the help of layered algorithm. The method is suit for different type of gear-box, and the impact of gear-box location inaccuracy is relatively small. The experiment shows that the method is feasible and the quality of glue-line can be accurately inspected. |
| 收录类别 | EI |
| 产权排序 | 1 |
| 会议主办者 | Wuhan University; Huazhong Normal University; Wuhan University of Technology; National Technology University of Ukraine; Columbia University |
| 会议录 | Proceedings - 2009 International Conference on Information Engineering and Computer Science, ICIECS 2009
 |
| 会议录出版者 | IEEE Computer Society |
| 会议录出版地 | Piscataway, NJ, USA |
| 语种 | 英语 |
| ISBN号 | 978-1-4244-4994-1 |
| 源URL | [http://ir.sia.cn/handle/173321/7675]  |
| 专题 | 沈阳自动化研究所_自动化系统研究室 |
| 推荐引用方式 GB/T 7714 | Chen S,Lin MX. A New Method for Automatic Quality Inspection of Glue-Line[C]. 见:2009 International Conference on Information Engineering and Computer Science, ICIECS 2009. Wuhan, China. December 19-20, 2009. |
入库方式： OAI收割
来源：沈阳自动化研究所
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