中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A shielded cantilever-tip microwave probe for MICRO/NANO surface imaging of conductive properties

文献类型:期刊论文

作者Yang, Y.L. ; Lai, K.J. ; Tang, Q.C. ; Kundhikanjana, W. ; Kelly, M. ; Shen, Z.X. ; Li,XX
刊名Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS).2011 IEEE 24th International Conference on Micro Electro Mechanical Systems, MEMS 2011
出版日期2011
页码79-82
ISSN号10846999
通讯作者Yang, Y. L.
收录类别EI-091
语种英语
公开日期2012-08-23
源URL[http://ir.sim.ac.cn/handle/331004/109216]  
专题上海微系统与信息技术研究所_微系统技术_期刊论文
推荐引用方式
GB/T 7714
Yang, Y.L.,Lai, K.J.,Tang, Q.C.,et al. A shielded cantilever-tip microwave probe for MICRO/NANO surface imaging of conductive properties[J]. Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS).2011 IEEE 24th International Conference on Micro Electro Mechanical Systems, MEMS 2011,2011:79-82.
APA Yang, Y.L..,Lai, K.J..,Tang, Q.C..,Kundhikanjana, W..,Kelly, M..,...&Li,XX.(2011).A shielded cantilever-tip microwave probe for MICRO/NANO surface imaging of conductive properties.Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS).2011 IEEE 24th International Conference on Micro Electro Mechanical Systems, MEMS 2011,79-82.
MLA Yang, Y.L.,et al."A shielded cantilever-tip microwave probe for MICRO/NANO surface imaging of conductive properties".Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS).2011 IEEE 24th International Conference on Micro Electro Mechanical Systems, MEMS 2011 (2011):79-82.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。