An artificial immune pattern recognition approach for damage classification in structures
文献类型：会议论文
| 作者 | Zhou Y(周悦); Tang S(唐世); Zang CZ(臧传治) ; Zhou, Rui
|
| 出版日期 | 2011 |
| 会议名称 | 2nd International Conference of Electrical and Electronics Engineering, ICEEE 2011 |
| 会议日期 | December 1-2, 2011 |
| 会议地点 | Macau, China |
| 关键词 | Damage detection Electronics engineering Electronics industry Industrial applications Information technology Learning algorithms Pattern recognition Research |
| 页码 | 11-17 |
| 中文摘要 | Structural Health Monitoring (SHM) is one of the research topics that have received growing interest in research communities. While a lot of efforts have been made in detecting damages in structures, very few researches have been conducted for the structure damage classification problem. This paper presents an artificial immune pattern recognition (AIPR) approach for the damage classification in structures. An AIPR-based Structure Damage Classifier (AIPR-SDC) has been developed, which incorporates several novel characteristics of the natural immune system. The immune learning algorithm can remember various data patterns by generating a set of memory cells that contain representative feature vectors for each pattern, which are extracted from the compressed data using the auto regression exogenous (ARX) algorithm. The AIPR-SDC approach has been tested using a benchmark structure proposed by the IASC-ASCE Structural Health Monitoring Task Group. The test results show the feasibility of using the AIPR-SDC method for the structure damage classification. © 2012 Springer-Verlag. |
| 收录类别 | EI |
| 产权排序 | 2 |
| 会议主办者 | International Industrial Electronics Center |
| 会议录 | Lecture Notes in Electrical Engineering
 |
| 会议录出版者 | Springer Verlag |
| 会议录出版地 | Heidelberg, Germany |
| 语种 | 英语 |
| ISSN号 | 1876-1100 |
| ISBN号 | 978-3-642-26000-1 |
| 源URL | [http://ir.sia.cn/handle/173321/9893]  |
| 专题 | 沈阳自动化研究所_工业信息学研究室 |
| 推荐引用方式 GB/T 7714 | Zhou Y,Tang S,Zang CZ,et al. An artificial immune pattern recognition approach for damage classification in structures[C]. 见:2nd International Conference of Electrical and Electronics Engineering, ICEEE 2011. Macau, China. December 1-2, 2011. |
入库方式： OAI收割
来源：沈阳自动化研究所
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