中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Common cause failure analysis of fault tolerance systems with diversity defense mechanism

文献类型:会议论文

作者Wang K(王锴); Xu AD(徐皑冬); Wang H(王宏); Song Y(宋岩); Bai ZY(白占元)
出版日期2012
会议名称2012 IEEE International Conference on Industrial Technology, ICIT 2012
会议日期March 19-21, 2012
会议地点Athens, Greece
关键词Reliability analysis
页码778-782
中文摘要Common cause failures (CCF) are a serious threat to redundant system reliability. It is therefore important to quantify and model CCF in reliability assessments. Design diversity has long been used to protect redundant systems against CCF. However, it is difficult to quantify the effects of diversity on system reliability. Therefore, a novel method based on Root Cause (RC) and Coupling Factor (CF) is proposed to assess diverse redundancy system reliability in this paper. The key idea of the novel method is to classify the RCs into (sub-)categories and then assess the corresponding CFs between redundant components respectively based characteristics of diversity. A novel CCF model is proposed to describe the relationship between CCF probability and diversity. Finally, aiming at the CCF induced by external environment stress an example is given to illustrate the usage of the novel method.
收录类别EI ; CPCI(ISTP)
产权排序1
会议主办者The Institute of Electrical andElectronics Engineers, Inc.; Industrial Electronics Society; University of Patras
会议录2012 IEEE International Conference on Industrial Technology, ICIT 2012, Proceedings
会议录出版者IEEE Computer Society
会议录出版地Piscataway, NJ
语种英语
ISBN号978-1-4673-0342-2
WOS记录号WOS:000309185900130
源URL[http://ir.sia.cn/handle/173321/9894]  
专题沈阳自动化研究所_工业控制网络与系统研究室
推荐引用方式
GB/T 7714
Wang K,Xu AD,Wang H,et al. Common cause failure analysis of fault tolerance systems with diversity defense mechanism[C]. 见:2012 IEEE International Conference on Industrial Technology, ICIT 2012. Athens, Greece. March 19-21, 2012.

入库方式: OAI收割

来源:沈阳自动化研究所

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