中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Verifying diversity defense mechanisms against common cause failures for safety instrumented systems using a stress-strength model

文献类型:会议论文

作者Wang K(王锴); Xu AD(徐皑冬); Wang H(王宏)
出版日期2012
会议名称2012 International Conference on Control Engineering and Communication Technology, ICCECT 2012
会议日期December 7-9, 2012
会议地点Shenyang, Liaoning, China
关键词Chemical reactors Communication Reliability analysis
页码362-367
中文摘要Common cause failure (CCF) is a serious threat to Safety Instrumented Systems (SIS) reliability. It is therefore important to model and quantify CCF in reliability analysis. Diversity has long been used to protect redundant systems against CCF. Whilst there is clear evidence that diversity can bring benefits when compared with identical redundancy systems, these benefits can be difficult to quantify. Therefore, a novel CCF model which studies CCF from the viewpoint of Root Cause (RC) and Coupling Factor is proposed in this paper. The key parameters of the novel CCF model can be determined based on a stress-strength model by classifying variables of stressors and strengths according to RC categories. An application example is provided that illustrates how the proposed CCF model performs for a chemical reactor safety system (CRSS) for protection against high pressure and temperature. The results not only confirm that diversity techniques lower the CCF probability but also provide quantitative assessment of how large the improvements can be in different diversity techniques. © 2012 IEEE.
收录类别EI ; CPCI(ISTP)
产权排序1
会议录Proceedings - 2012 International Conference on Control Engineering and Communication Technology, ICCECT 2012
语种英语
ISBN号978-0-7695-4881-4
WOS记录号WOS:000316387300088
源URL[http://ir.sia.cn/handle/173321/10404]  
专题沈阳自动化研究所_工业控制网络与系统研究室
推荐引用方式
GB/T 7714
Wang K,Xu AD,Wang H. Verifying diversity defense mechanisms against common cause failures for safety instrumented systems using a stress-strength model[C]. 见:2012 International Conference on Control Engineering and Communication Technology, ICCECT 2012. Shenyang, Liaoning, China. December 7-9, 2012.

入库方式: OAI收割

来源:沈阳自动化研究所

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