A Fast Surface Defect Detection Method Based on Background Reconstruction
文献类型：期刊论文
| 作者 | Lv, Chengkan2,3 ; Zhang, Zhengtao1,2,3; Shen, Fei1,2,3; Zhang, Feng1,2,3; Su, Hu1,2,3
|
| 刊名 | INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING
 |
| 出版日期 | 2019-11-09 |
| 页码 | 13 |
| 关键词 | Defect detection Unsupervised learning Background reconstruction |
| ISSN号 | 2234-7593 |
| DOI | 10.1007/s12541-019-00262-2 |
| 通讯作者 | Shen, Fei(fei.shen@ia.ac.cn) |
| 英文摘要 | In this paper, we propose an unsupervised background reconstruction method to detect defects on surfaces with unevenly distributed textures. An improved deep convolutional autoencoder is utilized to reconstruct the textured background of the original image as a defect-free reference. Specifically, a weighted loss function based on structural similarity (SSIM) is utilized to adapt to the unevenly distributed texture background and improve the reconstruction accuracy. Furthermore, combined with the reconstructed defect-free reference, a novel difference analysis method based on the discrete cosine transform (DCT) is given to accurately segment the defect regions from the original image. A series of experiments for the defect detection on mobile phone cover glass (MPCG) are conducted. The processing time for an image of 512 x 512 pixels is only 20 ms, which satisfies the requirement of online detection. The experimental results verify the effectiveness of the proposed method. |
| WOS关键词 | INSPECTION ; DEEP |
| 资助项目 | National Natural Science Foundation of China[61503378] ; Youth Innovation Promotion Association, CAS[2013097] |
| WOS研究方向 | Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000495300100001 |
| 出版者 | KOREAN SOC PRECISION ENG |
| 资助机构 | National Natural Science Foundation of China ; Youth Innovation Promotion Association, CAS |
| 源URL | [http://ir.ia.ac.cn/handle/173211/28884]  |
| 专题 | 精密感知与控制研究中心_精密感知与控制 |
| 通讯作者 | Shen, Fei |
| 作者单位 | 1.CASI Vis Technol CO LTD, Luoyang 471000, Henan, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 3.Chinese Acad Sci, Inst Automat, Res Ctr Precis Sensing & Control, Beijing 100190, Peoples R China |
| 推荐引用方式 GB/T 7714 | Lv, Chengkan,Zhang, Zhengtao,Shen, Fei,et al. A Fast Surface Defect Detection Method Based on Background Reconstruction[J]. INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING,2019:13. |
| APA | Lv, Chengkan,Zhang, Zhengtao,Shen, Fei,Zhang, Feng,&Su, Hu.(2019).A Fast Surface Defect Detection Method Based on Background Reconstruction.INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING,13. |
| MLA | Lv, Chengkan,et al."A Fast Surface Defect Detection Method Based on Background Reconstruction".INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING (2019):13. |
入库方式： OAI收割
来源：自动化研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。