中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Sensitive Quality-Relevant Fault Monitoring using Enhanced Sparse Projection to Latent Structures

文献类型:会议论文

作者Bai, Xiwei2,3; Wang, Xuelei2; Tan, Jie2; Qin, Wei4; Zhang, Tianren1; Sun, Wei1
出版日期2018
会议日期July 4-8, 2018
会议地点Changsha, China
英文摘要

As one of the most common and effective quality-relevant fault monitoring techniques, projection to latent structures(PLS) and its improved algorithms have been wildly used in many industries to provide assurance for high-quality products. In this paper, a new enhanced sparse projection to latent structures(ESPLS) algorithm is proposed to achieve quality-relevant fault monitoring with better sensitivity. The algorithm implements sparse orthogonal decomposition on input process variable space. Two indices based on quality-relevant subspace and quality-irrelevant subspace with major variation are developed for fault detection and analysis. Experiments on Tennessee Eastman Process (TEP) chemical benchmark reveal its outstanding performance in fault detection and superior accuracy in differentiating the quality-relevant and irrelevant impact of the given fault.

源URL[http://ir.ia.ac.cn/handle/173211/39264]  
专题综合信息系统研究中心_工业智能技术与系统
通讯作者Tan, Jie
作者单位1.Zhejiang Tianneng Energy Technology Co., Ltd.
2.Institute of Automation, Chinese Academy of Sciences
3.University of Chinese Academy of Sciences
4.Sinopec Zhongyuan Oilfield Puguang company gas production plant
推荐引用方式
GB/T 7714
Bai, Xiwei,Wang, Xuelei,Tan, Jie,et al. Sensitive Quality-Relevant Fault Monitoring using Enhanced Sparse Projection to Latent Structures[C]. 见:. Changsha, China. July 4-8, 2018.

入库方式: OAI收割

来源:自动化研究所

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