中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A Self-Supervised CNN for Particle Inspection on Optical Element

文献类型:期刊论文

作者Hou W(侯伟); Tao X(陶显); Xu D(徐德)
刊名IEEE Transactions on Instrumentation and Measurement
出版日期2021-05
卷号70期号:1页码:1-12
关键词Inspection Feature reuse optical element particle inspection self-supervised learning transfer learning
英文摘要

In high-power laser instruments, optical elements play a significant role. Particles on the optical element degrade the system performance and even cause damage to the optical element. In this article, a particle inspection model based on self-supervised convolutional neural networks (CNNs) and transfer learning is proposed. The self-supervised network that is built on a rotation-flip-invariant pretext task is used to transform the image from grayscale feature to rotation-flip-invariant feature. Then, the learned feature is transferred to the central-pixel classification network that is fine-tuned on a small labeled dataset. The experiments show that the classification accuracy of our proposed method is 97.90%, which is higher than the other compared methods. For the whole image prediction, through feature reuse and pointwise convolution, the central-pixel classification network is adapted to the particle inspection network efficiently with minor changes. Since the method utilizes massive unlabeled data and is fine-tuned on a small number of labeled samples, it has the potential to be used in industrial production.

语种英语
源URL[http://ir.ia.ac.cn/handle/173211/44874]  
专题精密感知与控制研究中心_精密感知与控制
通讯作者Tao X(陶显)
作者单位1.中国科学院自动化研究所
2.中国科学院大学人工智能学院
3.中国科学院自动化研究所
推荐引用方式
GB/T 7714
Hou W,Tao X,Xu D. A Self-Supervised CNN for Particle Inspection on Optical Element[J]. IEEE Transactions on Instrumentation and Measurement,2021,70(1):1-12.
APA Hou W,Tao X,&Xu D.(2021).A Self-Supervised CNN for Particle Inspection on Optical Element.IEEE Transactions on Instrumentation and Measurement,70(1),1-12.
MLA Hou W,et al."A Self-Supervised CNN for Particle Inspection on Optical Element".IEEE Transactions on Instrumentation and Measurement 70.1(2021):1-12.

入库方式: OAI收割

来源:自动化研究所

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