A Self-Supervised CNN for Particle Inspection on Optical Element
文献类型:期刊论文
| 作者 | Hou W(侯伟) ; Tao X(陶显) ; Xu D(徐德)
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| 刊名 | IEEE Transactions on Instrumentation and Measurement
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| 出版日期 | 2021-05 |
| 卷号 | 70期号:1页码:1-12 |
| 关键词 | Inspection Feature reuse optical element particle inspection self-supervised learning transfer learning |
| 英文摘要 | In high-power laser instruments, optical elements play a significant role. Particles on the optical element degrade the system performance and even cause damage to the optical element. In this article, a particle inspection model based on self-supervised convolutional neural networks (CNNs) and transfer learning is proposed. The self-supervised network that is built on a rotation-flip-invariant pretext task is used to transform the image from grayscale feature to rotation-flip-invariant feature. Then, the learned feature is transferred to the central-pixel classification network that is fine-tuned on a small labeled dataset. The experiments show that the classification accuracy of our proposed method is 97.90%, which is higher than the other compared methods. For the whole image prediction, through feature reuse and pointwise convolution, the central-pixel classification network is adapted to the particle inspection network efficiently with minor changes. Since the method utilizes massive unlabeled data and is fine-tuned on a small number of labeled samples, it has the potential to be used in industrial production. |
| 语种 | 英语 |
| 源URL | [http://ir.ia.ac.cn/handle/173211/44874] ![]() |
| 专题 | 精密感知与控制研究中心_精密感知与控制 |
| 通讯作者 | Tao X(陶显) |
| 作者单位 | 1.中国科学院自动化研究所 2.中国科学院大学人工智能学院 3.中国科学院自动化研究所 |
| 推荐引用方式 GB/T 7714 | Hou W,Tao X,Xu D. A Self-Supervised CNN for Particle Inspection on Optical Element[J]. IEEE Transactions on Instrumentation and Measurement,2021,70(1):1-12. |
| APA | Hou W,Tao X,&Xu D.(2021).A Self-Supervised CNN for Particle Inspection on Optical Element.IEEE Transactions on Instrumentation and Measurement,70(1),1-12. |
| MLA | Hou W,et al."A Self-Supervised CNN for Particle Inspection on Optical Element".IEEE Transactions on Instrumentation and Measurement 70.1(2021):1-12. |
入库方式: OAI收割
来源:自动化研究所
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