A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction
文献类型：期刊论文
| 作者 | Lv, Chengkan1,2 ; Shen, Fei1,2,3; Zhang, Zhengtao1,2,3; Xu, De1,2; He, Yonghao1,2,3
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| 刊名 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
 |
| 出版日期 | 2021 |
| 卷号 | 70页码:13 |
| 关键词 | Anomaly detection autoencoder background reconstruction defect inspection |
| ISSN号 | 0018-9456 |
| DOI | 10.1109/TIM.2020.3038413 |
| 通讯作者 | Zhang, Zhengtao(zhengtao.zhang@ia.ac.cn) |
| 英文摘要 | In this article, an anomaly detection method based on background reconstruction is proposed to perform defect inspection on the texture surface of the industrial products. This method consists of two modules: 1) an autoencoder integrated with a generative adversarial network is utilized to reconstruct the textured background of the original image as a defect-free reference. Specifically, extra anomalous images are introduced and a mapping method of anomaly is given to improve the stability of reconstruction. 2) A U-net based inspection network is trained to perform pixel-wise analysis of the differences between the original and the reconstructed defect-free image. During these processes, only artificial synthesized defective images are utilized to train the model without any real defective samples. A series of experiments are conducted on several texture image data sets and the industrial production line. The experimental results reveal the effectiveness and versatility of the proposed method. |
| WOS关键词 | ANOMALY DETECTION |
| 资助项目 | Youth Innovation Promotion Association, CAS[2020139] |
| WOS研究方向 | Engineering ; Instruments & Instrumentation |
| 语种 | 英语 |
| WOS记录号 | WOS:000691803600035 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| 资助机构 | Youth Innovation Promotion Association, CAS |
| 源URL | [http://ir.ia.ac.cn/handle/173211/45935]  |
| 专题 | 精密感知与控制研究中心_精密感知与控制 |
| 通讯作者 | Zhang, Zhengtao |
| 作者单位 | 1.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China 2.Univ Chinese Acad Sci, Sch Artificial Intelligence, Beijing 100049, Peoples R China 3.CASI Vis Technol Co Ltd, Luoyang 471000, Peoples R China |
| 推荐引用方式 GB/T 7714 | Lv, Chengkan,Shen, Fei,Zhang, Zhengtao,et al. A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2021,70:13. |
| APA | Lv, Chengkan,Shen, Fei,Zhang, Zhengtao,Xu, De,&He, Yonghao.(2021).A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,70,13. |
| MLA | Lv, Chengkan,et al."A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 70(2021):13. |
入库方式： OAI收割
来源：自动化研究所
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