Accurate Estimation of Tip Shape for Reconstructing AFM Image
文献类型:会议论文
作者 | Yuan S(袁帅); Liu LQ(刘连庆)![]() ![]() ![]() ![]() |
出版日期 | 2009 |
会议日期 | June 2-5, 2009 |
会议地点 | Traverse City, MI |
关键词 | Afm Blind Tip Estimation Porous Aluminium Math Morphology |
页码 | 96-99 |
英文摘要 | AFM image is often distorted due to the influence of the tip shape. This problem has become one of the major obstacles in nano-observation. Therefore it is necessary to develop a compensation method to improve the quality of the AFM image. The common used method today is image reconstruction with deconvolution operator based on the tip shape built through blind tip estimation algorithm. However, the current algorithm has difficulties in getting the optimal noise threshold, which is essential for reducing the noise influence during the tip evaluation. This paper proposed a new method to solve this problem, through which the optimal threshold can be easily determined based on the comparison of tip section profile P-alpha and tip standard profile P-s. The experimental results validate the effect of the proposed method, and it also shows that the image quality has been greatly improved. |
源文献作者 | IEEE |
产权排序 | 1 |
会议录 | 2009 IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE
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会议录出版者 | IEEE |
会议录出版地 | NEW YORK |
语种 | 英语 |
ISBN号 | 978-1-4244-4695-7 |
WOS记录号 | WOS:000273600300025 |
源URL | [http://ir.sia.cn/handle/173321/8533] ![]() |
专题 | 沈阳自动化研究所_机器人学研究室 |
通讯作者 | Yuan S(袁帅) |
作者单位 | 1.Graduate University of the Chinese Academy of Sciences, Beijing, China 2.State Key Laboratory of Robotics, Shenyang Institute of Automation, Shenyang, China 3.Department of Electrical and Computer Engineering, Michigan State University, United States |
推荐引用方式 GB/T 7714 | Yuan S,Liu LQ,Miao L,et al. Accurate Estimation of Tip Shape for Reconstructing AFM Image[C]. 见:. Traverse City, MI. June 2-5, 2009. |
入库方式: OAI收割
来源:沈阳自动化研究所
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