Detection and real-time correction of faulty visual feedback in atomic force microscopy based nanorobotic manipulation
文献类型：会议论文
| 作者 | Liu LQ(刘连庆) ; Luo, Yilun; Wang YC(王越超); Zhang JB(张江波); Li GY(李广勇)
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| 出版日期 | 2008 |
| 会议日期 | May 19-23, 2008 |
| 会议地点 | Pasadena, CA |
| 页码 | 431-436 |
| 英文摘要 | One of the main roadblocks to Atomic Force Microscope (AFM) based nanomanipulation is lack of real time visual feedback. Although the model based visual feedback can partly solve this problem, its unguaranteed reliability due to the inaccurate models in nano-environment still limits the efficiency of AFM based nanomanipulation. This paper introduce a Realtime Fault Detection and Correction (RFDC) method to improve the reliability of the visual feedback. By utilizing Kalman filter and local scan technologies, the RFDC method not only can realtime detect the fault display caused by the modeling error, but also can on-line correct it without interrupting manipulation. In this way, the visual feedback keeps consistent with the true environment changes during manipulation, which makes several operations being finished without a image scanning in between. The theoretical study and the implementation of the RFDC method are elaborated in this paper. Experiments of manipulating nano-particles have been carried out to demonstrate the effectiveness and efficiency of the proposed method. |
| 源文献作者 | IEEE |
| 产权排序 | 1 |
| 会议录 | 2008 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, VOLS 1-9
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| 会议录出版者 | IEEE |
| 会议录出版地 | NEW YORK |
| 语种 | 英语 |
| ISSN号 | 1050-4729 |
| ISBN号 | 978-1-4244-1646-2 |
| WOS记录号 | WOS:000258095000068 |
| 源URL | [http://ir.sia.cn/handle/173321/8645]  |
| 专题 | 沈阳自动化研究所_机器人学研究室 |
| 通讯作者 | Liu LQ(刘连庆); Luo, Yilun |
| 作者单位 | 1.Graduate School of Chinese Academy of Sciences, Beijing, 100001, China 2.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, Liaoning Province, 110016, China 3.Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48823, United States 4.Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA 15621, United States |
| 推荐引用方式 GB/T 7714 | Liu LQ,Luo, Yilun,Wang YC,et al. Detection and real-time correction of faulty visual feedback in atomic force microscopy based nanorobotic manipulation[C]. 见:. Pasadena, CA. May 19-23, 2008. |
入库方式： OAI收割
来源：沈阳自动化研究所
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