Feature referenced tip localization enhanced by probability motion model for AFM based nanomanipulations
文献类型：会议论文
| 作者 | Yuan S(袁帅); Liu LQ(刘连庆) ; Wang ZD(王志东); Wang YC(王越超); Dong ZL(董再励); Wang ZY(王智宇); Wang ZB(王智博)
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| 出版日期 | 2011 |
| 会议日期 | December 7-11, 2011 |
| 会议地点 | Phuket, Thailand |
| 关键词 | Creep Probabilistic Logic Sensors Trajectory Uncertainty Voltage Control |
| 页码 | 1421-1426 |
| 英文摘要 | The spatial uncertainties of tip positioning due to the nonlinearity of the PZT scanner and thermal drift hinder the further application of the AFM based nanomanipulation. This paper brings forward feature referenced tip localization enhanced by probability motion model to reduce the spatial uncertainties. An improved motion model is probabilistically built by incorporating the PI model, the creep model and the thermal drift model. For calibrating the accurate model parameters, the statistical experiments are designed and performed. Then the tip position is optimally estimated by combining with a local scan based feature sensing method. The simulation and corresponding experiments are performed to illustrate the validity and feasibility of the calibrated parameters and the algorithm. |
| 源文献作者 | IEEE Robotics and Automation Society |
| 产权排序 | 1 |
| 会议录 | 2011 IEEE International Conference on Robotics and Biomimetics (ROBIO)
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| 会议录出版者 | IEEE Computer Society |
| 会议录出版地 | Piscataway, NJ |
| 语种 | 英语 |
| ISBN号 | 978-1-4577-2136-6 |
| 源URL | [http://ir.sia.cn/handle/173321/8710]  |
| 专题 | 沈阳自动化研究所_机器人学研究室 |
| 通讯作者 | Yuan S(袁帅) |
| 作者单位 | 1.Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48823, United States 2.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, Liaoning Province 110016, China 3.College of Information and Control Engineering, Shenyang Jianzhu University, Shenyang, 110168, China 4.Graduate School of Chinese Academy of Sciences, Beijing 100001, China 5.Department of Advanced Robotics, Chiba Institute of Technology, Chiba, Japan |
| 推荐引用方式 GB/T 7714 | Yuan S,Liu LQ,Wang ZD,et al. Feature referenced tip localization enhanced by probability motion model for AFM based nanomanipulations[C]. 见:. Phuket, Thailand. December 7-11, 2011. |
入库方式： OAI收割
来源：沈阳自动化研究所
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