Real-time state estimation and fault detection for controlling atomic force microscope based Nano Manipualtion
文献类型：会议论文
| 作者 | Liu LQ(刘连庆) ; Luo, Yilun; Zhang JB(张江波); Li GY(李广勇); Wang YC(王越超)
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| 出版日期 | 2008 |
| 会议日期 | July 6-11, 2008 |
| 会议地点 | Seoul, Korea |
| 关键词 | Atomic Force Microscopy Fault Detection Micromanipulators Microsystems Nanotechnology Robotics Technology Visual Communication |
| 页码 | 9424-9429 |
| 英文摘要 | The main problem of Atomic Force Microscope (AFM) based nanomanipulation is the lack of real-time visual feedback. Although the model based visual feedback can partly solve this problem, the incorrect display caused by the uncertainties in the nano-environment often leads to a failed nanomanipulation. In this paper, a general strategy with three-level structure is proposed to overcome this problem. With this three-level strategy, the incorrect display can be not only real-time detected, but also on-line corrected. The difficulty to implement this strategy is that there is no continuous way to describe and model the system since both discrete and continuous commands are involved. A Petri-net based method is proposed to organize this strategy such that task scheduling, which usually deals with discrete events, as well as task planning, which usually deals with continuous events can be treated in a unified framework. This Petri-net organized strategy provides general instructions to AFM based manipulation for displaying a visual feedback which can be as close as possible to the true environment. The experimental results presented in the paper demonstrate the advantage of the proposed strategy. It also shows the increased efficiency of the AFM based nanomanipulation. |
| 源文献作者 | IFAC |
| 产权排序 | 1 |
| 会议录 | Proceedings of the 17th International Federation of Automatic Control (IFAC) World Congress
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| 会议录出版者 | IFAC |
| 语种 | 英语 |
| 源URL | [http://ir.sia.cn/handle/173321/8842]  |
| 专题 | 沈阳自动化研究所_机器人学研究室 |
| 通讯作者 | Liu LQ(刘连庆) |
| 作者单位 | 1.Robotics Laboratory, Chinese Academy of Sciences 2.Dept. of Electrical and Computer Engineering, Michigan State University 3.Dept.of Electrical and Computer Engineering, University of Pittsburgh 4.Graduate School of Chinese Academy of Sciences |
| 推荐引用方式 GB/T 7714 | Liu LQ,Luo, Yilun,Zhang JB,et al. Real-time state estimation and fault detection for controlling atomic force microscope based Nano Manipualtion[C]. 见:. Seoul, Korea. July 6-11, 2008. |
入库方式： OAI收割
来源：沈阳自动化研究所
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