Efficient Imaging and Real-time Display of Scanning Ion Conductance Microscopy Based on Block Compressive Sensing
文献类型：会议论文
| 作者 | Li GX(李恭新); Li P(李鹏); Wang YC(王越超) ; Wang WX(王文学); Liu LQ(刘连庆)
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| 出版日期 | 2013 |
| 会议日期 | August 26-30, 2013 |
| 会议地点 | Suzhou, China |
| 关键词 | Scanning Ion Conductance Microscopy (Sicm) Compressive Sensing (Cs) Blocks Compressive Sensing |
| 页码 | 114-118 |
| 英文摘要 | Scanning Ion Conductance Microscopy (SICM) is one kind of Scanning Probe Microscopies (SPMs), and it can be used in mapping topographical features of sample at high -resolution with free contact by measuring the ion current of ultra-micropipette. SICM is widely used in imaging soft samples for many distinct merits, such as high resolution imaging, simple preparation of probe and no harm to sample surface. However, it is undeniable that the scanning speed of SICM is much slower than other SPMs, especially for large scale and high resolution imaging. Fortunately, compressive sensing (CS), which breaks through the Shannon’s sampling theorem for dramatically reducing sample rate, could improve scanning speed tremendously, but it still costs much time in image reconstruction. Therefore block compressive sensing was applied to SICM imaging for reducing the reconstruction time of sparse signals, and it has an anther further and unique application that it can achieve the function of image real-time display. In this paper, a new method of dividing blocks and a new matrix arithmetic operation was proposed to build the block compressive sensing model, and several experiments was taken to verified the superiority of block compressive sensing in reducing imaging time and image real-time display used SICM. |
| 产权排序 | 1 |
| 会议录 | 3rd International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2013
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| 会议录出版者 | IEEE |
| 会议录出版地 | NEW YORK |
| 语种 | 英语 |
| ISBN号 | 978-1-4799-1210-0 |
| WOS记录号 | WOS:000350808700024 |
| 源URL | [http://ir.sia.cn/handle/173321/13908]  |
| 专题 | 沈阳自动化研究所_机器人学研究室 |
| 通讯作者 | Wang WX(王文学) |
| 作者单位 | 1.University of Chinese Academy of Sciences China, Beijing, 100049, China 2.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, 110016, China 3.Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, 48824, United States |
| 推荐引用方式 GB/T 7714 | Li GX,Li P,Wang YC,et al. Efficient Imaging and Real-time Display of Scanning Ion Conductance Microscopy Based on Block Compressive Sensing[C]. 见:. Suzhou, China. August 26-30, 2013. |
入库方式： OAI收割
来源：沈阳自动化研究所
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