Compensation of drift contamination in AFM image by local scan
文献类型：会议论文
| 作者 | Wang, Yucai; Li GY(李广勇) ; Liu LQ(刘连庆)
|
| 出版日期 | 2009 |
| 会议日期 | February 22-25, 2009 |
| 会议地点 | Bangkok, Thailand |
| 关键词 | Nanomanipulation Atomic Force Microscope Drift Compensation |
| 页码 | 487-492 |
| 英文摘要 | Thermal drift in atomic force microscopy (AFM) is one of the major hurdles to achieve accurate and efficient AFM based nanomanipulation. AFM images are all contaminated by the thermal drift which often leads to failed manipulation operations. In this paper, a local scan strategy is applied to identify the thermal drift contamination in the AFM image and then the draft contamination is compensated. After an AFM image is captured, the entire image is divided into several strips along y direction. A local scan is immediately performed in each part of the image to determine the drift at that portion. In this manner, the drift value is calculated in a small local area instead of the global image. Thus, the drift can be more precisely estimated and the image can be more accurately recovered, and thus leading to improved accuracy of AFM image and enhanced efficiency in AFM based nanomanipulation. |
| 源文献作者 | IEEE Robot & Automat Soc |
| 产权排序 | 3 |
| 会议录 | 2008 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND BIOMIMETICS, VOLS 1-4
 |
| 会议录出版者 | IEEE |
| 会议录出版地 | NEW YORK |
| 语种 | 英语 |
| ISBN号 | 978-1-4244-2678-2 |
| WOS记录号 | WOS:000271966900082 |
| 源URL | [http://ir.sia.cn/handle/173321/20031]  |
| 专题 | 沈阳自动化研究所_机器人学研究室 |
| 通讯作者 | Wang, Yucai |
| 作者单位 | 1.Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA 15261, United States 2.Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48824, United States 3.State Key Laboratory of Robotics, Shenyang Institute of Automation, Shenyang, Liaoning Province 110016, China |
| 推荐引用方式 GB/T 7714 | Wang, Yucai,Li GY,Liu LQ. Compensation of drift contamination in AFM image by local scan[C]. 见:. Bangkok, Thailand. February 22-25, 2009. |
入库方式： OAI收割
来源：沈阳自动化研究所
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