Micro-nano Scale Longitudinal Displacement Measurement of Microspheres Based on Digital Holography
文献类型：会议论文
| 作者 | Tang S(唐思)1,2,3 ; Shi JL(施佳林)2,3; Shi HY(石慧瑶)1,2,3; Yu P(于鹏)2,3; Su CM( 苏全民)2,3; Liu LQ(刘连庆)2,3
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| 出版日期 | 2021 |
| 会议日期 | October 22-25, 2021 |
| 会议地点 | Yantai, China |
| 关键词 | Digital holographic microscopy Measurement Three-dimensional position of microspheres |
| 页码 | 283-291 |
| 英文摘要 | Most of the existing measurements of microspheres are based on transmission, which use the light field through the microspheres and the substrate to form interference fringes, and then analyzes the movement and variation of the microspheres. Therefore, only transparent samples and transparent substrates can be measured, which greatly limits the measurement range and the application scenarios. In this paper, we present a near-field diffraction measurement for reflective microspheres. This method has no restrictions on the material of the microspheres themselves, and the substrate is no longer required to be the same material as the microspheres. Therefore, the range of measurement using microspheres will be greatly increased. In the case of microspheres with different materials and substrates, microspheres can not only be applied to simple cell measurement, but also are expected to be combined with other measurement methods in the future to further improve the measurement accuracy and measurement range of the existing measurement methods. © 2021, Springer Nature Switzerland AG. |
| 产权排序 | 1 |
| 会议录 | 2021 14th International Conference on Intelligent Robotics and Applications, ICIRA 2021
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| 会议录出版者 | Springer Science and Business Media Deutschland GmbH |
| 会议录出版地 | Berlin |
| 语种 | 英语 |
| ISSN号 | 0302-9743 |
| ISBN号 | 978-3-030-89097-1 |
| WOS记录号 | OS:000725394600027 |
| 源URL | [http://ir.sia.cn/handle/173321/29860]  |
| 专题 | 沈阳自动化研究所_机器人学研究室 |
| 通讯作者 | Liu LQ(刘连庆) |
| 作者单位 | 1.University of Chinese Academy of Sciences, Beijing, China 2.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China 3.Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang, 110169, China |
| 推荐引用方式 GB/T 7714 | Tang S,Shi JL,Shi HY,et al. Micro-nano Scale Longitudinal Displacement Measurement of Microspheres Based on Digital Holography[C]. 见:. Yantai, China. October 22-25, 2021. |
入库方式： OAI收割
来源：沈阳自动化研究所
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