Image saliency detection via multi-feature and manifold-space ranking
文献类型：会议论文
| 作者 | Li XL(李晓莉)1,2,3,4,5,6; Zhao HC(赵怀慈)4 ; Liu YP(刘云鹏)4
|
| 出版日期 | 2021 |
| 会议日期 | January 15-17, 2021 |
| 会议地点 | Bangkok, Thailand |
| 关键词 | Saliency detection manifold-space ranking multi-feature colorhistogram |
| 页码 | 76-81 |
| 英文摘要 | In this paper, we propose an image saliency detection method by using multi-feature and manifold-space ranking. Basically, the proposed method extracts the color-histogram feature to obtain the fine information of the image, and the color-mean feature to obtain the coarse information respectively. To further improve the detection accuracy of the feature correlation between different image units, a manifold-space ranking method is used to calculate saliency values of image units to construct a saliency map on each feature-space. Specifically, we fuse the two saliency maps to obtain the final saliency map. Extensive experiments demonstrate that the proposed method not only outperforms the other methods, but also improves the accuracy and robustness of the saliency detection. |
| 产权排序 | 1 |
| 会议录 | 2021 3rd Asia Pacific Information Technology Conference, APIT 2021
 |
| 会议录出版者 | ACM |
| 会议录出版地 | New York |
| 语种 | 英语 |
| ISBN号 | 978-1-4503-8810-8 |
| 源URL | [http://ir.sia.cn/handle/173321/28938]  |
| 专题 | 沈阳自动化研究所_光电信息技术研究室 |
| 通讯作者 | Li XL(李晓莉) |
| 作者单位 | 1.The Key Lab of Image Understanding and Computer Vision, Shenyang 110016, China 2.University of Chinese Academy of Sciences, Beijing 100049, China 3.Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang 110169, China 4.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China 5.Shenyang Jianzhu University, Shenyang 110168, China 6.Key Laboratory of Opto-Electronic Information Processing, Shenyang 110016, China |
| 推荐引用方式 GB/T 7714 | Li XL,Zhao HC,Liu YP. Image saliency detection via multi-feature and manifold-space ranking[C]. 见:. Bangkok, Thailand. January 15-17, 2021. |
入库方式： OAI收割
来源：沈阳自动化研究所
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