中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Key process protection of high dimensional process data in complex production

文献类型:期刊论文

作者Shi H(石贺)1,2,3,4; Shang WL(尚文利)1,2,3,4; Chen CY(陈春雨)1,2,3,4; Zhao JM(赵剑明)1,2,3,4; Yin L(尹隆)1,2,3,4
刊名Computers, Materials and Continua
出版日期2019
卷号60期号:2页码:645-658
关键词Industrial control system outlier detection anomaly detection system rule tree model
ISSN号1546-2218
产权排序1
英文摘要

In order to solve the problem of locating and protecting key processes and detecting outliers efficiently in complex industrial processes. An anomaly detection system which is based on the two-layer model fusion frame is designed in this paper. The key process is located by using the random forest model firstly, then the process data feature selection, dimension reduction and noise reduction are processed. Finally, the validity of the model is verified by simulation experiments. It is shown that this method can effectively reduce the prediction accuracy variance and improve the generalization ability of the traditional anomaly detection model from the experimental results.

WOS关键词DISTRIBUTED ANOMALY DETECTION ; DETECTION MODEL
资助项目National Natural Science Foundation of China[61773368] ; Strategic Priority Research Program of Chinese Academy of Sciences[XDC02000000] ; State Grid Corp of China's Science and Technology Project Application of Edge Computing in Smart Grid and Security Protection Technology Research[52110118001H]
WOS研究方向Computer Science ; Materials Science
语种英语
WOS记录号WOS:000510451800016
资助机构National Natural Science Foundation of China, 2018.01-2020. 12 (No. 61773368) ; Strategic Priority Research Program of Chinese Academy of Sciences (Grant No. XDC02000000) ; State Grid Corp of China’s Science and Technology Project “Application of Edge Computing in Smart Grid and Security Protection Technology Research” (52110118001H).
源URL[http://ir.sia.cn/handle/173321/25884]  
专题沈阳自动化研究所_工业控制网络与系统研究室
通讯作者Shang WL(尚文利)
作者单位1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China
2.Key Laboratory of Networked Control Systems, Chinese Academy of Sciences, Shenyang, China
3.Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang, China
4.University of Chinese academy of sciences, Beijing, China
推荐引用方式
GB/T 7714
Shi H,Shang WL,Chen CY,et al. Key process protection of high dimensional process data in complex production[J]. Computers, Materials and Continua,2019,60(2):645-658.
APA Shi H,Shang WL,Chen CY,Zhao JM,&Yin L.(2019).Key process protection of high dimensional process data in complex production.Computers, Materials and Continua,60(2),645-658.
MLA Shi H,et al."Key process protection of high dimensional process data in complex production".Computers, Materials and Continua 60.2(2019):645-658.

入库方式: OAI收割

来源:沈阳自动化研究所

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