The effect of sample surface roughness on the microanalysis of microchip laser-induced breakdown spectroscopy
文献类型:期刊论文
作者 | Wang W(汪为)1,2,3,4,5![]() ![]() ![]() ![]() ![]() ![]() ![]() |
刊名 | Journal of Analytical Atomic Spectrometry
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出版日期 | 2020 |
卷号 | 35期号:2页码:357-365 |
ISSN号 | 0267-9477 |
产权排序 | 1 |
英文摘要 | In the microanalysis of laser-induced breakdown spectroscopy, the influence of surface roughness on spectral stability and quantitative analysis capability was studied for the first time when the laser ablation crater diameter was approximately 10 μm. By using a microchip laser, the spectra were acquired on a set of carbon steel samples, whose roughness changed from 0.0392 μm to 0.5248 μm. Besides, the study found that the surface roughness of the sample neglected the effect on spectral stability via screening and analyzing the spectral data when the sample stage moved at a constant speed. Moreover, when the spectral collection was performed with the ablation crater overlap rate of approximately 75% and Fe line was used as the internal standard, the effect of sample surface roughness on the quantitative analysis of the spectrum was negligible, and the resulting calculated determination coefficients of the Mn, Si, Ni, V, Cr, and Cu elements all exceeded 0.993. |
WOS关键词 | FEMTOSECOND ; STEEL ; SPECTROMETRY ; PLASMA ; PICOSECOND ; TOPOGRAPHY ; ABLATION ; LIBS |
资助项目 | National Key Research and Development Program of China[2017YFF0106202] ; Key Research Program of Frontier Sciences, CAS[QYZDJ-SSW-JSC037] ; LiaoNing Revitalization Talents Program[XLYC1807110] ; Youth Innovation Promotion Association, CAS |
WOS研究方向 | Chemistry ; Spectroscopy |
语种 | 英语 |
WOS记录号 | WOS:000514606000011 |
资助机构 | National Key Research and Development Program of China (2017YFF0106202) ; Key Research Program of Frontier Sciences, CAS (QYZDJ-SSWJSC037) ; LiaoNing Revitalization Talents Program (XLYC1807110) ; Youth Innovation Promotion Association, CAS |
源URL | [http://ir.sia.cn/handle/173321/26307] ![]() |
专题 | 沈阳自动化研究所_工业控制网络与系统研究室 |
通讯作者 | Sun LX(孙兰香) |
作者单位 | 1.University of Chinese Academy of Sciences, Beijing 100049, China 2.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China 3.Key Laboratory of Networked Control System, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China 4.Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang 110169, China 5.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China |
推荐引用方式 GB/T 7714 | Wang W,Sun LX,Wang GD,et al. The effect of sample surface roughness on the microanalysis of microchip laser-induced breakdown spectroscopy[J]. Journal of Analytical Atomic Spectrometry,2020,35(2):357-365. |
APA | Wang W.,Sun LX.,Wang GD.,Zeng P.,Qi LF.,...&Dong W.(2020).The effect of sample surface roughness on the microanalysis of microchip laser-induced breakdown spectroscopy.Journal of Analytical Atomic Spectrometry,35(2),357-365. |
MLA | Wang W,et al."The effect of sample surface roughness on the microanalysis of microchip laser-induced breakdown spectroscopy".Journal of Analytical Atomic Spectrometry 35.2(2020):357-365. |
入库方式: OAI收割
来源:沈阳自动化研究所
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