System Error Calibration in Large Datasets of Wireless Channel Sounding for Industrial Applications
文献类型:期刊论文
作者 | Wang Q(王琪)2,3,4,5; Candell, Richard6; Liang W(梁炜)3,4,5; Pang ZB(庞智博)7,8 |
刊名 | IEEE Journal of Emerging and Selected Topics in Industrial Electronics |
出版日期 | 2022 |
卷号 | 3期号:1页码:113-123 |
ISSN号 | 2687-9735 |
关键词 | Channel impulse response (CIR) calibration National Institute of Standards and Technology (NIST) dataset physical layer authentication synchronization wireless channel sounding |
产权排序 | 1 |
英文摘要 | Channel impulse response (CIR) datasets, which represent the characteristics of wireless channels, play a vital role in industrial applications. Unfortunately, systematic errors have been discovered within CIR datasets. These errors have undesirable effects in wireless localization, physical layer security, and related applications. In addition, existing CIR calibration methods do not consider applicability to industrial scenarios. To address this concern, two channel sounder error calibration (CSEC) methods are proposed. The first CSEC method based on phase compensation (CSEC-Phase) extracts the direct path signal to estimate errors to avoid interference from rich multipath signals for stationary measurements in complex industrial environments. Moreover, to solve the problem of the inability to estimate the CIR error in mobile measurements due to the rapid dynamic change of the channel, a second CSEC method based on carrier frequency recovery (CSEC-Frequency) is proposed that extracts the frequency offset of the system clock to compensate for systematic error utilizing the stability of clock drift. Furthermore, the L1-norm distance metric is employed to measure the differences between CIRs and evaluate the calibration performance. Our results reveal that the proposed CSEC methods are effective on diverse CIR datasets measured by different11The MATLAB code of the CSEC methods has been shared on GitHub: https://github.com/QiWang-GH/Industrial-Wireless-Channel-Sounding-Error-Calibration-IW-CSEC. equipment in different scenarios. |
语种 | 英语 |
资助机构 | Special Fund for Strategic Pilot Technology of the Chinese Academy of Sciences under Grant XDC02020600 ; Liaoning Provincial Natural Science Foundation of China under Grant 2020JH2/10500002 ; Liaoning Revitalization Talents Program under Grant XLYC1902110 ; National Natural Science Foundation of China under Grant 62022088 ; International Partnership Program of Chinese Academy of Sciences under Grant 173321KYSB20180020 and Grant 173321KYSB20200002 |
源URL | [http://ir.sia.cn/handle/173321/30297] |
专题 | 沈阳自动化研究所_工业控制网络与系统研究室 |
通讯作者 | Liang W(梁炜) |
作者单位 | 1.Department of Intelligent Systems, Royal Institute of Technology (KTH), 11428 Stockholm, Sweden 2.University of Chinese Academy of Sciences, Beijing 100049, China 3.Institutes for Robotics, and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang 110169, China 4.State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China 5.Key Laboratory of Networked Control Systems, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China 6.Intelligent Systems Division, National Institute of Standards and Technology, Gaithersburg 7.MD, United States 8.Department of Automation Technology, ABB Corporate Research Sweden, Vasteras, Sweden |
推荐引用方式 GB/T 7714 | Wang Q,Candell, Richard,Liang W,et al. System Error Calibration in Large Datasets of Wireless Channel Sounding for Industrial Applications[J]. IEEE Journal of Emerging and Selected Topics in Industrial Electronics,2022,3(1):113-123. |
APA | Wang Q,Candell, Richard,Liang W,&Pang ZB.(2022).System Error Calibration in Large Datasets of Wireless Channel Sounding for Industrial Applications.IEEE Journal of Emerging and Selected Topics in Industrial Electronics,3(1),113-123. |
MLA | Wang Q,et al."System Error Calibration in Large Datasets of Wireless Channel Sounding for Industrial Applications".IEEE Journal of Emerging and Selected Topics in Industrial Electronics 3.1(2022):113-123. |
入库方式: OAI收割
来源:沈阳自动化研究所
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