Automatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison
文献类型:期刊论文
作者 | Peng, Zhengrui1; Gong, Xinyi2![]() |
刊名 | ELECTRONICS
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出版日期 | 2021-11-01 |
卷号 | 10期号:21页码:14 |
关键词 | fabric defect unsupervised learning computer vision deep learning |
DOI | 10.3390/electronics10212652 |
文献子类 | SCI |
英文摘要 | Due to the huge demand for textile production in China, fabric defect detection is particularly attractive. At present, an increasing number of supervised deep-learning methods are being applied in surface defect detection. However, the annotation of datasets in industrial settings often depends on professional inspectors. Moreover, the methods based on supervised learning require a lot of annotation, which consumes a great deal of time and costs. In this paper, an approach based on self-feature comparison (SFC) was employed that accurately located and segmented fabric texture images to find anomalies with unsupervised learning. The SFC architecture contained the self-feature reconstruction module and the self-feature distillation. Accurate fiber anomaly location and segmentation were generated based on these two modules. Compared with the traditional methods that operate in image space, the comparison of feature space can better locate the anomalies of fiber texture surfaces. Evaluations were performed on the three publicly available databases. The results indicated that our method performed well compared with other methods, and had excellent defect detection ability in the collected textile images. In addition, the visual results showed that our results can be used as a pixel-level candidate label. |
资助项目 | Science and Technology Project of the State Grid Corporation of China[52094020006F] |
WOS研究方向 | Computer Science ; Engineering ; Physics |
语种 | 英语 |
WOS记录号 | WOS:000718975800001 |
出版者 | MDPI |
资助机构 | Science and Technology Project of the State Grid Corporation of China |
源URL | [http://ir.ia.ac.cn/handle/173211/46458] ![]() |
专题 | 精密感知与控制研究中心_精密感知与控制 |
通讯作者 | Meng, Shixiong |
作者单位 | 1.State Grid Shanghai Elect Power Res Inst, Shanghai 200437, Peoples R China 2.Chinese Acad Sci, Inst Automat, Res Ctr Precis Sensing & Control, Beijing 100190, Peoples R China 3.China Univ Min & Technol, Sch Mech Elect & Informat Engn, Beijing 100083, Peoples R China |
推荐引用方式 GB/T 7714 | Peng, Zhengrui,Gong, Xinyi,Wei, Bengang,et al. Automatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison[J]. ELECTRONICS,2021,10(21):14. |
APA | Peng, Zhengrui,Gong, Xinyi,Wei, Bengang,Xu, Xiangyi,&Meng, Shixiong.(2021).Automatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison.ELECTRONICS,10(21),14. |
MLA | Peng, Zhengrui,et al."Automatic Unsupervised Fabric Defect Detection Based on Self-Feature Comparison".ELECTRONICS 10.21(2021):14. |
入库方式: OAI收割
来源:自动化研究所
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