中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Quantitative imaging of advanced nanostructured materials with scattering-type scanning near-field optical microscopy

文献类型:会议论文

作者Stanciu, Stefan G.; Tranca, Denis E.; Pastorino, Laura; Boi, Stefania; Song, Young Min; Yoo, Young Jin; Ishii, Satoshi; Yang, Fang; Wu, Aiguo; Hristu, Radu
出版日期2019
会议日期MAY 31-JUN 04, 2019
卷号11207
DOI10.1117/12.2527401
英文摘要Scattering-type Scanning Near Field Optical Microscopy (s-SNOM) has been demonstrated as a valuable tool for revealing important properties of materials at nanoscale. Recent proof-of-concept experiments have shown that, among others, s-SNOM can provide quantitative information on the real and imaginary parts of the dielectric function, and hence of intrinsic optical properties of materials and biological samples. In this work we further explored these capabilities in several experiments dealing with microcapsules for drug delivery, ultra-thin optical coatings with tunable color properties, and two types of nanoparticles with important applications in energy storage and conversion, or biosensing and theranostics.
会议录出版者Proceedings of SPIE
学科主题Engineering ; Optics ; Physics
ISSN号0277-786X
ISBN号978-1-5106-3164-9
源URL[http://ir.nimte.ac.cn/handle/174433/23302]  
专题会议专题
会议专题_会议论文
推荐引用方式
GB/T 7714
Stanciu, Stefan G.,Tranca, Denis E.,Pastorino, Laura,et al. Quantitative imaging of advanced nanostructured materials with scattering-type scanning near-field optical microscopy[C]. 见:. MAY 31-JUN 04, 2019.

入库方式: OAI收割

来源:宁波材料技术与工程研究所

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