中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Microstructure damage in silicon carbide fiber induced by 246.8-MeV Ar-ion irradiation

文献类型:会议论文

作者Zhang, Liqing; Zhang, Chonghong; Huang, Qing; Ding, Zhaonan; Yan, Tingxing; Chen, Yuguang; Su, Changhao
出版日期2018
会议日期JUL 02-07, 2017
关键词FLOW CHANNEL INSERT COMPOSITES
卷号435
DOI10.1016/j.nimb.2018.06.002
英文摘要Microstructure characterizations of silicon carbide (SiC) fibers irradiated with 246.8-MeV Ar16+ at different fluences were investigated using transmission electron microscopy (TEM), Raman scattering spectroscopy and scanning electron microscopy (SEM). TEM results reveal that 3C-SiC grains were surrounded by the carbon ribbons. The size of 3C-SiC grains first decreases and then increases with increasing ion fluence. Raman spectra display that SiC fiber consists of both 3C-SiC and abundant graphite phase. A redshift of the vibration mode of 3C-SiC in the fibers occured as compared with that of standard bulk 3C-SiC. Meanwhile, 4H-SiC phase was observed after irradiation. Furthermore, scattering intensity of all peaks in Raman spectra first reduces and then increases with increasing ion fluence, indicating that damage accumulates at low fluences and subsequently recovers to some extent at higher fluences. SEM results exhibit that the diameter of SiC fibers first shrinks and then expands, simultaneously, carbon concentration on fibers surface decreases while silicon concentration increases gradually, with increasing ion fluence, accompanied by an adsorption of oxygen.
学科主题Instruments & Instrumentation ; Nuclear Science & Technology ; Physics
ISSN号0168-583X
源URL[http://ir.nimte.ac.cn/handle/174433/23346]  
专题会议专题
会议专题_会议论文
推荐引用方式
GB/T 7714
Zhang, Liqing,Zhang, Chonghong,Huang, Qing,et al. Microstructure damage in silicon carbide fiber induced by 246.8-MeV Ar-ion irradiation[C]. 见:. JUL 02-07, 2017.

入库方式: OAI收割

来源:宁波材料技术与工程研究所

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