中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A novel method to assess the effect of diversity on Common Cause Failure mitigation

文献类型:会议论文

作者Wang K(王锴); Xu AD(徐皑冬); Wang H(王宏); Liu J(刘捷); Song Y(宋岩)
出版日期2013
会议名称2013 IEEE International Conference on Industrial Technology, ICIT 2013
会议日期February 25-28, 2013
会议地点Cape Town, South africa
关键词Common cause failure Component degradation diversity Impact factor Impact vectors
页码1204-1209
中文摘要Redundancy techniques are widely used to design fault tolerant systems. Diversity has long been used to protect redundant systems from Common Cause Failure (CCF). Whilst there is clear evidence that diversity can bring benefits, these benefits can be difficult to quantify. Therefore, a novel method which researches the effect of diversity on CCF mitigation from the component degradation state point of view is proposed in this paper. Four categories of impact factors (IFs), which influence the failure behavior of the component, are defined and the corresponding method of mapping diversity into component degradation valve (CDV) has been proposed aiming at the characteristics of each IF category. Then CCF analysis is performed based on weighted impact vectors which can be calculated from CDVs. Due to related reliability data has been collected for each IF category the method has a good applying prospect. An illustrative case study is presented, which shows the application process of the novel method.
收录类别EI ; CPCI(ISTP)
产权排序1
会议主办者The Institute of Electrical and Electronics Engineers (IEEE); IEEE Industrial Electronics Society (IES); IEEE Technology Management Council; IEEE Region 8; IEEE South Africa Section IE/IA/PEL Joint Chapter
会议录Proceedings of the IEEE International Conference on Industrial Technology
会议录出版者IEEE
会议录出版地Piscataway, NJ
语种英语
ISBN号978-14673-4569-9
WOS记录号WOS:000322785200188
源URL[http://ir.sia.cn/handle/173321/12419]  
专题沈阳自动化研究所_工业控制网络与系统研究室
推荐引用方式
GB/T 7714
Wang K,Xu AD,Wang H,et al. A novel method to assess the effect of diversity on Common Cause Failure mitigation[C]. 见:2013 IEEE International Conference on Industrial Technology, ICIT 2013. Cape Town, South africa. February 25-28, 2013.

入库方式: OAI收割

来源:沈阳自动化研究所

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