中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A New Diagnosis Method with Few-shot Learning Based on a Class-rebalance Strategy for Scarce Faults in Industrial Processes

文献类型:期刊论文

作者Xu, Xinyao1,2; Xu, De1,2; Qin, Fangbo1
刊名Machine Intelligence Research
出版日期2023-02
页码1-12
关键词data augmentation feature clustering class-rebalance strategy few-shot learning fault diagnosis
ISSN号1751-8520
DOI10.1007/s11633-022-1363-y
产权排序1
文献子类research paper
英文摘要

    For industrial processes, new scarce faults are usually judged by experts. The lack of instances for these faults causes a severe data imbalance problem for a diagnosis model and leads to low performance. In this article, a new diagnosis method with few-shot learning based on a class-rebalance strategy is proposed to handle the problem. The proposed method is designed to transform instances of the different faults into a feature embedding space. In this way, the fault features can be transformed into separate feature clusters. The fault representations are calculated as the centers of feature clusters. The representations of new faults can also be effectively calculated with few support instances. Therefore, fault diagnosis can be achieved by estimating feature similarity between instances and faults. A cluster loss function is designed to enhance the feature clustering performance. Also, a class-rebalance strategy with data augmentation is designed to imitate potential faults with different reasons and degrees of severity to improve the model′s generalizability. It improves the diagnosis performance of the proposed method. Simulations of fault diagnosis with the proposed method were performed on the Tennessee-Eastman benchmark. The proposed method achieved average diagnosis accuracies ranging from 81.8% to 94.7% for the eight selected faults for the simulation settings of support instances ranging from 3 to 50. The simulation results verify the effectiveness of the proposed method.

语种英语
出版者Machine Intelligence Research
源URL[http://ir.ia.ac.cn/handle/173211/52082]  
专题精密感知与控制研究中心_精密感知与控制
通讯作者Xu, De
作者单位1.Research Center of Precision Sensing and Control, Institute of Automation, Chinese Academy of Sciences
2.School of Artificial Intelligence, University of Chinese Academy of Sciences
推荐引用方式
GB/T 7714
Xu, Xinyao,Xu, De,Qin, Fangbo. A New Diagnosis Method with Few-shot Learning Based on a Class-rebalance Strategy for Scarce Faults in Industrial Processes[J]. Machine Intelligence Research,2023:1-12.
APA Xu, Xinyao,Xu, De,&Qin, Fangbo.(2023).A New Diagnosis Method with Few-shot Learning Based on a Class-rebalance Strategy for Scarce Faults in Industrial Processes.Machine Intelligence Research,1-12.
MLA Xu, Xinyao,et al."A New Diagnosis Method with Few-shot Learning Based on a Class-rebalance Strategy for Scarce Faults in Industrial Processes".Machine Intelligence Research (2023):1-12.

入库方式: OAI收割

来源:自动化研究所

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