中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A line mapping based automatic registration algorithm of infrared and visible images

文献类型:会议论文

作者Ai R(艾锐); Shi ZL(史泽林); Xu DJ(徐德江); Zhang CS(张程硕)
出版日期2013
会议名称5th International Symposium on Photoelectronic Detection and Imaging (ISPDI) - Infrared Imaging and Applications
会议日期June 25-27, 2013
会议地点Beijing
关键词There exist complex gray mapping relationships among infrared and visible images because of the different imaging mechanisms. The difficulty of infrared and visible image registration is to find a reasonable similarity definition. In this paper, we develop a novel image similarity called implicit linesegment similarity(ILS) and a registration algorithm of infrared and visible images based on ILS. Essentially, the algorithm achieves image registration by aligning the corresponding line segment features in two images. First, we extract line segment features and record their coordinate positions in one of the images, and map these line segments into the second image based on the geometric transformation model. Then we iteratively maximize the degree of similarity between the line segment features and correspondence regions in the second image to obtain the model parameters. The advantage of doing this is no need directly measuring the gray similarity between the two images. We adopt a multi-resolution analysis method to calculate the model parameters from coarse to fine on Gaussian scale space. The geometric transformation parameters are finally obtained by the improved Powell algorithm. Comparative experiments demonstrate that the proposed algorithm can effectively achieve the automatic registration for infrared and visible images, and under considerable accuracy it makes a more significant improvement on computational efficiency and anti-noise ability than previously proposed algorithms.
页码1-9
收录类别EI ; CPCI(ISTP)
产权排序1
会议主办者Chinese Soc Astronaut, Photoelectron Technol Comm, Tianjin Jinhang Inst Tech Phys, Sci & Technol Low Light Level Night Vis Lab, Sci & Technol Opt Radiat Lab, Sci & Technol Electromagnet Scattering Lab, SPIE, Opt Soc, European Opt Soc, Chinese Soc Astronaut
会议录INTERNATIONAL SYMPOSIUM ON PHOTOELECTRONIC DETECTION AND IMAGING 2013: INFRARED IMAGING AND APPLICATIONS
会议录出版者SPIE-INT SOC OPTICAL ENGINEERING
会议录出版地BELLINGHAM
语种英语
ISSN号0277-786X
ISBN号978-0-8194-9776-5
WOS记录号WOS:000325423700080
源URL[http://ir.sia.cn/handle/173321/13844]  
专题沈阳自动化研究所_光电信息技术研究室
推荐引用方式
GB/T 7714
Ai R,Shi ZL,Xu DJ,et al. A line mapping based automatic registration algorithm of infrared and visible images[C]. 见:5th International Symposium on Photoelectronic Detection and Imaging (ISPDI) - Infrared Imaging and Applications. Beijing. June 25-27, 2013.

入库方式: OAI收割

来源:沈阳自动化研究所

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