Assessment of the Effect of Common Cause Failure and Diversity on Diagnostic Coverage of a Self-checking Pair
文献类型：会议论文
| 作者 | Wang K(王锴) ; Xu AD(徐皑冬); Liu MZ(刘明哲); Song Y(宋岩); Jin N(金妮)
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| 出版日期 | 2013 |
| 会议名称 | 2013 11th IEEE International Conference on Electronic Measurement & Instruments |
| 会议日期 | August 16-19, 2013 |
| 会议地点 | Harbin, China |
| 关键词 | automatic diagnosis diagnostic coverage common cause failure diversity self-checking pair |
| 页码 | 849-854 |
| 中文摘要 | It is important to consider diagnostic coverage (DC) of the automatic diagnosis (AD) scheme in course of the design of highly reliable systems in which redundancy technique is usually applied. Considering the nature of AD is to introduce some form of redundancy, its performance will be affected by common cause failure (CCF). Due to that diversity is an effective antidote for CCF, it is desirable to assess the effect of diversity and CCF on DC. Therefore, a novel method is proposed to quantitatively compare two different AD schemes which include identical redundancy and diverse redundancy based on the protection (data integrity) they provide against CCF in this paper. The AD schemes considered are implemented in the form of self-checking pairs. For the first time, the relationship among diversity, CCF rate and DC is quantified by the proposed method. A two-channel redundant system in which each redundant element employs a self-checking pair is used as an illustration case. The results confirm that the diversity technique increases the DC of the self-checking pair. |
| 收录类别 | EI ; CPCI（ISTP） |
| 产权排序 | 1 |
| 会议录 | 2013 11th IEEE International Conference on Electronic Measurement & Instruments
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| 会议录出版者 | IEEE |
| 会议录出版地 | NEW YORK |
| 语种 | 英语 |
| ISBN号 | 978-1-4799-0759-5 |
| WOS记录号 | WOS:000333836900178 |
| 源URL | [http://ir.sia.cn/handle/173321/13868]  |
| 专题 | 沈阳自动化研究所_工业控制网络与系统研究室 |
| 推荐引用方式 GB/T 7714 | Wang K,Xu AD,Liu MZ,et al. Assessment of the Effect of Common Cause Failure and Diversity on Diagnostic Coverage of a Self-checking Pair[C]. 见:2013 11th IEEE International Conference on Electronic Measurement & Instruments. Harbin, China. August 16-19, 2013. |
入库方式： OAI收割
来源：沈阳自动化研究所
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