Design and develop of functional safety temperature transmitter for fault status
文献类型：会议论文
| 作者 | Wang ZP(王志平) ; Xu AD(徐皑冬); Song Y(宋岩); Yan BJ(闫炳均)
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| 出版日期 | 2013 |
| 会议名称 | 2013 International Conference on Mechanical and Electronics Engineering, ICMEE 2013 |
| 会议日期 | August 17-18, 2013 |
| 会议地点 | Tianjin, China |
| 关键词 | Electronics engineering Flip flop circuits Safety engineering Voltage measurement |
| 页码 | 1272-1277 |
| 中文摘要 | According to the requirements of the functional safety temperature transmitter high reliability, this paper selects the micro-power voltage reference, the reset monitor, the D-type flip-flop and the OR gate to design the functional safety temperature transmitter protection circuit for fault status. The protection circuit takes power from the data line of HART fieldbus by micro-power voltage references. According to the control signal of the functional safety transmitter, the protection circuit utilizes the state latch of D-type flip-flop, and realizes the functional safety temperature transmitter protection circuit for fault status. © (2013) Trans Tech Publications, Switzerland. |
| 收录类别 | EI |
| 产权排序 | 1 |
| 会议主办者 | Tianjin University of Technology; Kagawa University; Hefei University of Technology |
| 会议录 | Applied Mechanics and Materials
 |
| 会议录出版者 | Trans Tech Publications Ltd, |
| 会议录出版地 | Zurich-Durnten, Switzerland |
| 语种 | 英语 |
| ISSN号 | 1660-9336 |
| ISBN号 | 978-3-03785-810-3 |
| 源URL | [http://ir.sia.cn/handle/173321/13871]  |
| 专题 | 沈阳自动化研究所_工业控制网络与系统研究室 |
| 推荐引用方式 GB/T 7714 | Wang ZP,Xu AD,Song Y,et al. Design and develop of functional safety temperature transmitter for fault status[C]. 见:2013 International Conference on Mechanical and Electronics Engineering, ICMEE 2013. Tianjin, China. August 17-18, 2013. |
入库方式： OAI收割
来源：沈阳自动化研究所
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