The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode
文献类型：期刊论文
| 作者 | Zhao ZX(赵增旭); Tian XJ(田孝军) ; Liu J(刘杰); Dong ZL(董再励); Liu LQ(刘连庆)
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| 刊名 | CHINESE SCIENCE BULLETIN
 |
| 出版日期 | 2014 |
| 卷号 | 59期号:14页码:1591-1596 |
| 关键词 | Electrical properties of CNT EFM Lift-up height of probe Phase response |
| ISSN号 | 1001-6538 |
| 产权排序 | 1 |
| 通讯作者 | 田孝军 |
| 中文摘要 | Nowadays, one of the bottlenecks which hinder the development and application of carbon nanotube (CNT) nano device is that no pure semiconducting CNT (s-CNT) or metallic CNT (m-CNT) can be obtained, and for solving this problem scientists proposed some methods on preparation or separation, but all the results still should be detected and feedback to the process for further improving the preparation and separation methods. Thus, it is very important to measure and distinguish the electrical properties of CNT. For that, scientists proposed a method to measure CNT electrical properties based on DC electrostatic force microscope (EFM) mode, which distinguishes m-CNT from s-CNT according to different scan line shape to CNT with different electrical properties. But, we discovered that the probe lift-up height will seriously affect the shape of the scan line, which makes this method not reliable in distinguishing m-CNT from s-CNT. In this paper, the authors deeply researched the influence of probe lift-up height and also gave corresponding theoretical analysis and explanation, which will greatly improve the method of detecting CNT electrical properties by EFM. |
| 类目[WOS] | Multidisciplinary Sciences |
| 研究领域[WOS] | Science & Technology - Other Topics |
| 关键词[WOS] | WALLED CARBON NANOTUBES ; SEPARATION ; GROWTH |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000335392000015 |
| 源URL | [http://ir.sia.cn/handle/173321/14756]  |
| 专题 | 沈阳自动化研究所_机器人学研究室 |
| 推荐引用方式 GB/T 7714 | Zhao ZX,Tian XJ,Liu J,et al. The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode[J]. CHINESE SCIENCE BULLETIN,2014,59(14):1591-1596. |
| APA | Zhao ZX,Tian XJ,Liu J,Dong ZL,&Liu LQ.(2014).The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode.CHINESE SCIENCE BULLETIN,59(14),1591-1596. |
| MLA | Zhao ZX,et al."The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode".CHINESE SCIENCE BULLETIN 59.14(2014):1591-1596. |
入库方式： OAI收割
来源：沈阳自动化研究所
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