Lot release strategy semiconductor assembly and testing based on the degree of constraint of the minimum spanning tree
文献类型：会议论文
| 作者 | Zhang GH(张国辉); Liu C(刘昶) ; Yao LL(姚丽丽); Shi HB(史海波)
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| 出版日期 | 2014 |
| 会议名称 | 26th Chinese Control and Decision Conference, CCDC 2014 |
| 会议日期 | May 31, 2014 - June 2, 2014 |
| 会议地点 | Changsha, China |
| 关键词 | Graph theory |
| 页码 | 1735-1739 |
| 中文摘要 | The production of semiconductor assembly and testing is wide variety, and the cost of produce time of switch between different products is not the same, which could lead to its utilization is lower, production cycle longer. Thus lot release control plays an important role for improving utilization and shorter production cycle for semiconductor assembly and testing system. In this paper, we modeled as a graph theory for solving constrained minimum spanning tree problem. Using mainstream Prim algorithm, we solve it to give each product sequence and specific lot release time. It have solved the extra time problem that caused by blinding lot release, and finally, through applied research we verified the effectiveness and superiority of it. The proposed strategy can reduce the change machine costs, shorten production cycle and improve production efficiency. © 2014 IEEE. |
| 收录类别 | EI ; CPCI（ISTP） |
| 产权排序 | 2 |
| 会议录 | 26th Chinese Control and Decision Conference, CCDC 2014
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| 会议录出版者 | IEEE Computer Society |
| 会议录出版地 | Washington, DC |
| 语种 | 英语 |
| ISBN号 | 978-1-4799-3706-6 |
| WOS记录号 | WOS:000343577701170 |
| 源URL | [http://ir.sia.cn/handle/173321/15144]  |
| 专题 | 沈阳自动化研究所_数字工厂研究室 |
| 推荐引用方式 GB/T 7714 | Zhang GH,Liu C,Yao LL,et al. Lot release strategy semiconductor assembly and testing based on the degree of constraint of the minimum spanning tree[C]. 见:26th Chinese Control and Decision Conference, CCDC 2014. Changsha, China. May 31, 2014 - June 2, 2014. |
入库方式： OAI收割
来源：沈阳自动化研究所
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