Automated Recognition and Measurement of Cell Morphology on Optically-induced Electrokinetic Patterning Chip
文献类型:会议论文
作者 | Xie YP(谢艳鹏)![]() ![]() ![]() ![]() |
出版日期 | 2014 |
会议名称 | 11th World Congress on Intelligent Control and Automation (WCICA 2014) |
会议日期 | June 29 - July 4, 2014 |
会议地点 | Shenyang, China |
关键词 | Optically-induced Electrokinetics Automated System Cell behavior Image Processing Pattern Recognition |
页码 | 5646-5651 |
中文摘要 | Cell behaviors including adhesion, migration, proliferation, differentiation and apoptosis, etc. deeply influence tissue formation, regeneration, and even the function of whole tissue or entity. Optically-induced electrokinetic (OEK) patterning is an efficient method to guide cells to grow and form the desired structure on a substrate and hence becomes an effective approach to the study of cell behaviors. But recognition and measurement of large number of cells are challengeable. In this study, automated recognition and measurement of cellular geometric features on the patterned substrate using the OEK method is proposed in which the recognition of cells is realized by segmenting individual cells from the microscope image using snake computation model with dynamic programming and the geometric features such as area, perimeter, semi-major axis and orientation angle are extracted for the study of cell behaviors. The relation between the geometric features and cell behaviors has been studied. The automated system can recognize and measure the geometric features of cells rapidly, accurately and efficiently, and bring more convenience for development of biology and life science. |
收录类别 | EI |
产权排序 | 1 |
会议录 | Proceeding of the 11th World Congress on Intelligent Control and Automation
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会议录出版者 | IEEE |
会议录出版地 | Piscataway, NJ, USA |
语种 | 英语 |
ISBN号 | 978-1-4799-5825-2 |
源URL | [http://ir.sia.cn/handle/173321/15380] ![]() |
专题 | 沈阳自动化研究所_机器人学研究室 |
推荐引用方式 GB/T 7714 | Xie YP,Liu N,Yu P,et al. Automated Recognition and Measurement of Cell Morphology on Optically-induced Electrokinetic Patterning Chip[C]. 见:11th World Congress on Intelligent Control and Automation (WCICA 2014). Shenyang, China. June 29 - July 4, 2014. |
入库方式: OAI收割
来源:沈阳自动化研究所
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