中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Automated Recognition and Measurement of Cell Morphology on Optically-induced Electrokinetic Patterning Chip

文献类型:会议论文

作者Xie YP(谢艳鹏); Liu N(刘娜); Yu P(于鹏); Wang WX(王文学); Liu LQ(刘连庆); Wang XL(王秀莲)
出版日期2014
会议名称11th World Congress on Intelligent Control and Automation (WCICA 2014)
会议日期June 29 - July 4, 2014
会议地点Shenyang, China
关键词Optically-induced Electrokinetics Automated System Cell behavior Image Processing Pattern Recognition
页码5646-5651
中文摘要Cell behaviors including adhesion, migration, proliferation, differentiation and apoptosis, etc. deeply influence tissue formation, regeneration, and even the function of whole tissue or entity. Optically-induced electrokinetic (OEK) patterning is an efficient method to guide cells to grow and form the desired structure on a substrate and hence becomes an effective approach to the study of cell behaviors. But recognition and measurement of large number of cells are challengeable. In this study, automated recognition and measurement of cellular geometric features on the patterned substrate using the OEK method is proposed in which the recognition of cells is realized by segmenting individual cells from the microscope image using snake computation model with dynamic programming and the geometric features such as area, perimeter, semi-major axis and orientation angle are extracted for the study of cell behaviors. The relation between the geometric features and cell behaviors has been studied. The automated system can recognize and measure the geometric features of cells rapidly, accurately and efficiently, and bring more convenience for development of biology and life science. 
收录类别EI
产权排序1
会议录Proceeding of the 11th World Congress on Intelligent Control and Automation
会议录出版者IEEE
会议录出版地Piscataway, NJ, USA
语种英语
ISBN号978-1-4799-5825-2
源URL[http://ir.sia.cn/handle/173321/15380]  
专题沈阳自动化研究所_机器人学研究室
推荐引用方式
GB/T 7714
Xie YP,Liu N,Yu P,et al. Automated Recognition and Measurement of Cell Morphology on Optically-induced Electrokinetic Patterning Chip[C]. 见:11th World Congress on Intelligent Control and Automation (WCICA 2014). Shenyang, China. June 29 - July 4, 2014.

入库方式: OAI收割

来源:沈阳自动化研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。