中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Wavelet neural networks for intelligent fault diagnosis

文献类型:会议论文

作者Guo QJ(郭前进); Yu HB(于海斌); Xu AD(徐皑冬)
出版日期2005
会议名称International Symposium on Intelligence Computation and Applications
会议日期April 4-6, 2005
会议地点Wuhan, China
关键词wavelet neural networks intelligent fault diagnosis wavelet transform feature extraction
页码477-485
通讯作者郭前进
中文摘要Wavelet neural networks (WNN) combing the properties of the wavelet transform and the advantages of Artificial Neural Networks (ANNs) have attracted great interest and become a popular tool for various fields of mathematics and engineering. We describe here the application of WNN to the fault diagnosis of rotating machinery. In this paper, the wavelet network architecture for intelligent fault diagnosis is first introduced. Then an optimization method of neural network and a training algorithm is developed. Finally, Feedforward backpropagation neural network (BP) and wavelet neural networks are compared for fault diagnosis. The aim of this study is to examine the effective of the WNN model for fault diagnosis. Experiment results shows that the WNN has advantages of rapid training, generality and accuracy over feedforward backpropagation neural network.
收录类别CPCI(ISTP)
产权排序1
会议主办者China Assoc Aerosp, Natl Nat Sci Fdn China, China Univ Geosci, China Univ Geosci Press
会议录Progress in Intelligence Computation & Applications
会议录出版者CHINA UNIV GEOSCIENCES PRESS
会议录出版地WUHAN
语种英语
ISBN号7-5625-1983-8
WOS记录号WOS:000231083700077
源URL[http://ir.sia.cn/handle/173321/8148]  
专题沈阳自动化研究所_工业信息学研究室_工业控制系统研究室
推荐引用方式
GB/T 7714
Guo QJ,Yu HB,Xu AD. Wavelet neural networks for intelligent fault diagnosis[C]. 见:International Symposium on Intelligence Computation and Applications. Wuhan, China. April 4-6, 2005.

入库方式: OAI收割

来源:沈阳自动化研究所

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