AFM tip-induced dielectrophoresis for 3D manipulation of nanoparticles
文献类型：会议论文
| 作者 | Zhou PL(周培林) ; Cong PT(丛培田); Yu HB(于海波); Li P(李鹏); Wei FN(魏发南); Liu LQ(刘连庆)
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| 出版日期 | 2014 |
| 会议名称 | 4th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2014 |
| 会议日期 | October 27-31, 2014 |
| 会议地点 | Taipei, Taiwan |
| 关键词 | AFM Dielectrophoresis 3D manipulation Nanoparticles Nanoparticles |
| 页码 | 177-181 |
| 通讯作者 | 于海波 |
| 中文摘要 | Atomic force microscopy (AFM) and dielectrophoresis (DEP) technologies have been used as excellent tools for nanomanipulation and nanoassembly. AFM-based manipulation exhibits excellent positioning and very high accuracy. The advantage of DEP is its ability to carry out parallel and massive manipulation of nanomaterials. In this study, we develop AFM tip-induced dielectrophoresis for three dimensional (3D) manipulation of nanoparticles by integrating AFM with DEP techniques. A spatially nonuniform electric field can be induced when applying alternating current (AC) voltage between the AFM tip and a glass substrate coated with a thin layer of indium tin oxide (ITO). This work mainly focuses on the theoretical analysis and numerical simulation of the electric-field distribution between the probe tip and the ITO glass. Finally, we experimentally demonstrate the manipulation and assembly of dielectric nanoparticles with an average diameter of 200 nm. Compared with the traditional DEP method, predesigned electrodes are not required. The spatial electric-field distribution depends on the position of the AFM probe. Therefore, AFM-tip-induced dielectrophoresis is more flexible and efficient. |
| 收录类别 | EI ; CPCI（ISTP） |
| 产权排序 | 1 |
| 会议录 | 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2014 - Conference Proceedings
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| 会议录出版者 | IEEE |
| 会议录出版地 | Piscataway, NJ, USA |
| 语种 | 英语 |
| ISSN号 | 2373-5422 |
| ISBN号 | 978-1-4799-7923-3 |
| WOS记录号 | WOS:000380389000026 |
| 源URL | [http://ir.sia.ac.cn/handle/173321/16114]  |
| 专题 | 沈阳自动化研究所_机器人学研究室 |
| 推荐引用方式 GB/T 7714 | Zhou PL,Cong PT,Yu HB,et al. AFM tip-induced dielectrophoresis for 3D manipulation of nanoparticles[C]. 见:4th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2014. Taipei, Taiwan. October 27-31, 2014. |
入库方式： OAI收割
来源：沈阳自动化研究所
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