中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
半导体研究所 [5]
采集方式
OAI收割 [5]
内容类型
会议论文 [5]
发表日期
2008 [2]
2007 [1]
2002 [1]
2000 [1]
学科主题
光电子学 [5]
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学科主题:光电子学
内容类型:会议论文
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Characterization of bulk ZnO single crystal grown by a CVT method - art. no. 68410F
会议论文
OAI收割
conference on solid state lighting and solar energy technologies, beijing, peoples r china, nov 12-14, 2007
Wei, XC
;
Zhao, YW
;
Dong, ZY
;
Li, JM
收藏
  |  
浏览/下载:40/0
  |  
提交时间:2010/03/09
zinc oxide
X-ray diffraction
defects
single crystal
Native deep level defects in ZnO single crystal grown by CVT method - art. no. 68410I
会议论文
OAI收割
conference on solid state lighting and solar energy technologies, beijing, peoples r china, nov 12-14, 2007
Zhao, YW
;
Zhang, F
;
Zhang, R
;
Dong, ZY
;
Wei, XC
;
Zeng, YP
;
Li, JM
收藏
  |  
浏览/下载:43/0
  |  
提交时间:2010/03/09
zinc oxide
defect
vacancy
Heavily doped polycrystalline 3C-SiC growth on SiO2/Si(100) substrates for resonator applications
会议论文
OAI收割
6th european conference on silicon carbide and related materials, newcastle upon tyne, england, sep, 2006
Sun, G (Sun, Guosheng)
;
Ning, J (Ning, Jin)
;
Liu, X (Liu, Xingfang)
;
Zhao, Y (Zhao, Yongmei)
;
Li, J (Li, Jiaye)
;
Wang, L (Wang, Lei)
;
Zhao, W (Zhao, Wanshun)
;
Wang, L (Wang, Liang)
收藏
  |  
浏览/下载:87/29
  |  
提交时间:2010/03/29
polycrystalline 3C-SiC
resonator
doping
SILICON-CARBIDE
Stress analysis of silica-based arrayed waveguide grating by a finite element method
会议论文
OAI收割
photonics asia symposium 2002, shanghai, peoples r china, oct 14-18, 2002
Deng XQ
;
Yang QQ
;
Wang HJ
;
Hu XW
;
Wang QM
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2010/10/29
finite element method
stress
silica optical waveguide on silicon
birefringence
OPTICAL WAVE-GUIDES
DIFFERENCE METHOD
Influences of initial buffer layer deposition on electrical and optical properties in cubic GaN grown on GaAs(100) by metalorganic chemical vapor deposition
会议论文
OAI收割
1st asian conference on chemical vapour deposition, shanghai, peoples r china, may 10-13, 1999
作者:
Zhao DG
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2010/11/15
cubic GaN
buffer layer
atomic force microscopy
reflection high-energy electron diffraction
MOVPE