机构

• 长春光学精密机械与物... [3]

采集方式

• OAI收割 [3]

内容类型

• 会议论文 [3]

发表日期

• 2012 [1]
• 2010 [1]
• 2006 [1]

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浏览/检索结果: 共3条，第1-3条 帮助 限定条件 内容类型：会议论文    专题：长春光学精密机械与物理研究所    第一署名单位    第一作者单位    通讯作者单位     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序题名升序题名降序作者升序作者降序发表日期升序发表日期降序 Comparison of radiation temperature measurement precision between middlewave and longwave thermal-imaging systems (EI CONFERENCE) 会议论文  OAI收割 2012 International Conference on Optoelectronics and Microelectronics, ICOM 2012, August 23, 2012 - August 25, 2012, Changchun, China 作者:  Sun Z. 收藏  |  浏览/下载：15/0  |  提交时间：2013/03/25 A comparison study on temperature measurement precision between middlewave 3-5m and longwave 8-12m measuring thermal imaging systems has been conducted. The study was limited to systems working in indoor conditions and the target's temperature is in the range of 270K900K. First  the Disturb Resisting Function (DRF) of infrared systems is deduced. On the base of DRF curve  we find that the middlewave infrared system get the smaller influences under the same size disturb compared with the longwave system. A theory of the influence of target's physical characteristic and measurement conditions on the accuracy of temperature measurements has been developed. On the basis of the developed formulas an analysis of the influence of signal disturbances (because of incorrectly assumed emissivity  limited transmittance of the atmosphere  radiation reflected by the object and shift of optics radiation) on the accuracy of temperature measurement has been made. It has been found that the middlewave systems in typical temperature range offer generally better accuracy in temperature measurement than the longwave ones do. 2012 IEEE.   Thermal difference analysis and athermalization design of infrared optical system (EI CONFERENCE) 会议论文  OAI收割 Optical Design and Testing IV, October 18, 2010 - October 20, 2010, Beijing, China 作者:  Zhang X.;  Zhang X.;  Zhang X. 收藏  |  浏览/下载：25/0  |  提交时间：2013/03/25 When infrared optical system works in a large temperature range  the thermal effect of optical lens and optical tube will produce image plane shift and lead to imaging quality deterioration. In order to eliminate the thermal aberration  the athermalization design principles of infrared optical system were introduced  and some commonly used methods of thermal difference compensation were described. Proceeding from single lens  the thermal difference caused by temperature changing was analyzed  and the relationship between temperature and focus shift was obtained. Considering optical tube thermal expansion  a set of equations to estimate the thermal difference of lens group was given. Finally  an infrared optical imaging system that can work under the temperature range of -40C to 60C was design according to athermal technique  in which a new mechanical passive temperature compensation was proposed. Through simulation  the athermalization design could make imaging plane shift the smallest. The simulation results coincided with the theoretical formula  and the design had reference value in engineering. 2010 Copyright SPIE - The International Society for Optical Engineering.   Integrated mach-zehnder micro-interferometer for gas trace remote sensing (EI CONFERENCE) 会议论文  OAI收割 ICO20: Remote Sensing and Infrared Devices and Systems, August 21, 2005 - August 26, 2005, Changchun, China 作者:  Wang P. 收藏  |  浏览/下载：28/0  |  提交时间：2013/03/25 The realisation process and the preliminary tests on the performances of an integrated Mach-Zehnder Interferometer on LiNbO3 (Lithium Niobate) substrate is presented. The microsystem has been obtained by using medium mass Ion Implantation on X-cut Lithium Niobate crystals. The interferometer is formed by integrated optical channel waveguides: the phase shift between the two optical paths has been obtained  1mm 2 cross section and weights a few grams. The power consumption is in the milliwatt range. In the present work results obtained in the spectral window (0.4m-1.1m) will be presented. The performance of the device  without moving parts  evaluated on standard radiation sources  by applying a suitable electric field. The whole device is 60mm long  demonstrates that a spectral resolution better than 0.3nm can be obtained on 400nm spectral windows. The Micro-interferometer has been tested in laboratory with a calibrated cell containing NO2 gas and has demonstrated sensitivity in the ppb range if suitable optical paths are used. Its reduced dimensions and weights make these micro-systems ideal for a wide range of applications  has a 0.57times  spanning from Space Technology  Earth observation for Environment monitoring  to Safety and Security applications.