中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页
机构
成果
学者
登录
注册
登陆
×
验证码:
换一张
忘记密码?
记住我
×
校外用户登录
CAS IR Grid
机构
长春光学精密机械与物... [1]
采集方式
OAI收割 [1]
内容类型
会议论文 [1]
发表日期
2010 [1]
学科主题
筛选
浏览/检索结果:
共1条,第1-1条
帮助
限定条件
专题:长春光学精密机械与物理研究所
第一署名单位
第一作者单位
通讯作者单位
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
题名升序
题名降序
提交时间升序
提交时间降序
作者升序
作者降序
发表日期升序
发表日期降序
Modulation transfer function measurement of sampled imaging systems in field test (EI CONFERENCE)
会议论文
OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者:
Yang L.
;
Zhang J.
;
Zhang J.
;
Zhang J.
;
Wang J.
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2013/03/25
A digital mirror device (DMD) based light projector was developed as the target generator in modulation transfer function (MTF) measurement. In order to overcome the sampling-scene phase effect in MTF measurement of sampled imaging systems
a method using random targets is introduced to yield a phase-averaged MTF. The main potential problem of implementing this method is the fact that the stationary assumption of the random targets may be vitiated in practical measurement
especially in field test due to the ill condition. We provide an efficient model-independent way of analyzing and isolating the spectral contents arising from these additional contributions to MTF measurement. Algorithms with adaptive parameter selection were also developed for spectral estimation of the test image in order to overcome the challenge brought by the size limit of the test matrices for one certain field of view derived from the isoplantic region. The MTF measurement of a CCD video imager is used to demonstrate the measurement technique and illustrate the benefits over other methods. In order to validate the results
comparisons have been made between MTF measurements of imager implemented using this method and bar target direct measurements. 2010 Copyright SPIE - The International Society for Optical Engineering.