机构

• 金属研究所 [5]
• 新疆理化技术研究所 [1]

采集方式

• OAI收割 [6]

内容类型

• 期刊论文 [6]

发表日期

• 2024 [5]
• 2021 [1]

学科主题

筛选

浏览/检索结果: 共6条，第1-6条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择作者升序作者降序发表日期升序发表日期降序题名升序题名降序提交时间升序提交时间降序 Energy-saving hydrogen production by seawater electrolysis coupling tip-enhanced electric field promoted electrocatalytic sulfion oxidation 期刊论文  OAI收割 NATURE COMMUNICATIONS, 2024, 卷号: 15, 期号: 1, 页码: 12 作者:  Li, Tongtong;  Wang, Boran;  Cao, Yu;  Liu, Zhexuan;  Wang, Shaogang   |  收藏  |  浏览/下载：1/0  |  提交时间：2025/04/27 Energy-saving hydrogen production by seawater electrolysis coupling tip-enhanced electric field promoted electrocatalytic sulfion oxidation 期刊论文  OAI收割 NATURE COMMUNICATIONS, 2024, 卷号: 15, 期号: 1, 页码: 12 作者:  Li, Tongtong;  Wang, Boran;  Cao, Yu;  Liu, Zhexuan;  Wang, Shaogang   |  收藏  |  浏览/下载：1/0  |  提交时间：2025/04/27 Energy-saving hydrogen production by seawater electrolysis coupling tip-enhanced electric field promoted electrocatalytic sulfion oxidation 期刊论文  OAI收割 NATURE COMMUNICATIONS, 2024, 卷号: 15, 期号: 1, 页码: 12 作者:  Li, Tongtong;  Wang, Boran;  Cao, Yu;  Liu, Zhexuan;  Wang, Shaogang   |  收藏  |  浏览/下载：1/0  |  提交时间：2025/04/27 Unraveling Paradoxical Effects of Large Current Density on Zn Deposition 期刊论文  OAI收割 ADVANCED MATERIALS, 2024, 页码: 9 作者:  Liu, Zhexuan;  Liu, Jiachang;  Xiao, Xiao;  Zheng, Zhiyang;  Zhong, Xiongwei   |  收藏  |  浏览/下载：1/0  |  提交时间：2025/04/27 large current density  nucleation  plane growth  separator channel  zinc-based battery   Unraveling Paradoxical Effects of Large Current Density on Zn Deposition 期刊论文  OAI收割 ADVANCED MATERIALS, 2024, 页码: 9 作者:  Liu, Zhexuan;  Liu, Jiachang;  Xiao, Xiao;  Zheng, Zhiyang;  Zhong, Xiongwei   |  收藏  |  浏览/下载：1/0  |  提交时间：2025/04/27 large current density  nucleation  plane growth  separator channel  zinc-based battery   TID Response and Radiation-Enhanced Hot-Carrier Degradation in 65-nm nMOSFETs: Concerns on the Layout-Dependent Effects 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 8, 页码: 1565-1570 作者:  Ren, ZX (Ren, Zhexuan);  1An, X (An, Xia) 1;  Li, GS (Li, Gensong) 1;  Liu, JY (Liu, Jingyi) 1;  Xun, MZ (Xun, Mingzhu) 2   |  收藏  |  浏览/下载：65/0  |  提交时间：2021/09/22 65 nmhot-carrier injection (HCI)layout-dependent effect (LDE)nMOSstressthreshold voltagetotal ionizing dose (TID)