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Microstructure of titanium oxide films investigated by atomic force microscopy and transmission electron microscopy 期刊论文  OAI收割
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 卷号: 142, 期号: 1-2, 页码: 61-66
Zhang, F; Liu, XH; Jin, S; Bender, H; Lou, NZ; Wilson, ZH
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