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Anomalous bias-stress-induced unstable phenomena of InZnO thin-film transistors using Ta2O5 gate dielectric 期刊论文  OAI收割
JOURNAL OF PHYSICS D: APPLIED PHYSICS, 2012, 期号: 45, 页码: —
曹鸿涛; Wangying Xu, Mingzhi Dai, Lingyan Liang, Zhimin Liu, Xilian Sun, QingWan and Hongtao Cao
收藏  |  浏览/下载:21/0  |  提交时间:2013/12/16
Anomalous bias-stress-induced unstable phenomena of InZnO thin-film transistors using Ta2O5 gate dielectric 期刊论文  OAI收割
J PHYS D APPL PHYS, 2012, 期号: 45, 页码: 205103-1—205103-5
Cao HT(曹鸿涛); Wangying Xu, Mingzhi Dai, Lingyan Liang, Zhimin Liu, Xilian Sun, QingWan and Hongtao Cao
收藏  |  浏览/下载:20/0  |  提交时间:2013/12/16