机构

• 金属研究所 [5]
• 半导体研究所 [5]
• 上海光学精密机械研究... [3]
• 力学研究所 [2]
• 长春光学精密机械与物... [2]
• 微电子研究所 [2]
• 更多

采集方式

• OAI收割 [24]
• iSwitch采集 [1]

内容类型

• 期刊论文 [21]
• 会议论文 [2]
• 外文期刊 [2]

发表日期

• 2019 [1]
• 2014 [1]
• 2013 [1]
• 2012 [2]
• 2009 [3]
• 2008 [6]
• 更多

学科主题

• 半导体材料 [4]
• 光学薄膜 [3]

筛选

浏览/检索结果: 共25条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Oxidation kinetics of nanocrystalline Al thin films 期刊论文  OAI收割 Anti-Corrosion Methods and Materials, 2019, 卷号: 66, 期号: 5, 页码: 638-643 作者:  J.S.Luo;  L.G.Zhang;  H.G.Yang;  N.Zhang;  Y.F.Zhu   |  收藏  |  浏览/下载：42/0  |  提交时间：2020/08/24 Al,Grain boundary diffusion,Nanocrystalline films,Oxidation kinetics,resistive evaporation,thermal-oxidation,aluminum,mechanism,al(111),growth,al2o3,cu2o,Metallurgy & Metallurgical Engineering   Local Structure and Superconducting Properties of Bi2Te3-Doped YBa2Cu3O7-delta 期刊论文  OAI收割 JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM, 2014, 卷号: 27, 期号: 8, 页码: 1819—1824 Dong, XG; Zhao, WJ; Tang, YK; Duan, PQ; Zhang, HG; Li, YT; Liu, H; Ge, XP; Li, Q 收藏  |  浏览/下载：41/0  |  提交时间：2015/03/13 TOPOLOGICAL INSULATORS  NANOMETER AL2O3  THIN-FILMS  BI2SE3   Good sensitivity and high stability of humidity sensor using micro-arc oxidation alumina film 期刊论文  OAI收割 Electrochemistry Communications, 2013, 卷号: 28, 页码: 95-99 X. H. Guo; K. Q. Du; H. Ge; Q. Z. Guo; Y. Wang; F. H. Wang 收藏  |  浏览/下载：18/0  |  提交时间：2013/12/24 Humidity sensor  Sensitivity  Stability  Micro-arc oxidation  Al2O3  thin-films  al2o3  anodization   The film thickness dependent thermal stability of Al2O3:Ag thin films as high-temperature solar selective absorbers 期刊论文  OAI收割 journal of nanoparticle research, 2012, 卷号: 14, 期号: 3 作者:  Xiao, Xiudi;  Xu, Gang;  Xiong, Bin;  Chen, Deming;  Miao, Lei 收藏  |  浏览/下载：33/0  |  提交时间：2016/10/27 Al2O3:Ag thin films  Solar selective absorbers  SPR absorption  Thermal stability  Energy conversion   The scaling behavior of sputtered Ni3Al coatings with and without Pt modification 期刊论文  OAI收割 Corrosion Science, 2012, 卷号: 58, 页码: 115-120 J. M. Niu; W. Wang; S. L. Zhu; F. H. Wang 收藏  |  浏览/下载：23/0  |  提交时间：2013/02/05 Platinum  Sputtered films  SEM  XRD  Oxidation  high-temperature oxidation  al2o3 scales  platinum  alloys  resistance  aluminide  superalloys  nickel  interdiffusion  grain   Influence of Si crystallization evolution on 1.54 mu m luminescence in Er-doped Si/Al2O3 multilayer 期刊论文  OAI收割 Acta Physica Sinica, 2009, 卷号: 58, 期号: 6, 页码: 4243-4248 J. Z. Wang, Z. Q. Shi, H. N. Lou, X. L. Zhang, Z. W. Zuo, L. Pu, E. Ma, R. Zhang, Y. L. Zheng, F. Lu and Y. Shi 收藏  |  浏览/下载：13/0  |  提交时间：2012/11/06 Er  Si nanocrystal  sensitizer  Al2O3  photoluminescence  silicon  erbium  mechanisms  films  glass   Photoluminescence of Al2O3:CeCl3 Films by Medium Frequency Reactive Magnetron Sputtering 期刊论文  OAI收割 RARE METAL MATERIALS AND ENGINEERING, 2009, 卷号: 38, 期号: 4, 页码: 700-704 作者:  Liao Guojin;  Luo Hong;  Yan Shaofeng;  Ba Dechun;  Wen Lishi   |  收藏  |  浏览/下载：20/0  |  提交时间：2021/02/02 photoluminescence  Al2O3  thin films  magnetron sputtering  CeCl3   Tunable Luminescence in Monodisperse Zirconia Spheres 期刊论文  OAI收割 langmuir, 2009, 卷号: 25, 期号: 12, 页码: 7078-7083 Zhang CM; Li CX; Yang J; Cheng ZY; Hou ZY; Fan Y; Lin J 收藏  |  浏览/下载：215/16  |  提交时间：2010/05/27 CARBOXYLIC-ACID SOLVOLYSIS  WHITE-LIGHT EMISSION  SOL-GEL PROCESS  PHOTOLUMINESCENCE  PHOSPHORS  AL2O3  FILMS  PURE  SIO2  UREA   Preparation and luminescent property of Al2O3 : Ce thin films by medium frequency react magnetron sputtering 期刊论文  OAI收割 RARE METAL MATERIALS AND ENGINEERING, 2008, 卷号: 37, 期号: 3, 页码: 490-494 作者:  Liao Guojin;  Ba Dechun;  Wen Lishi;  Zhu Zhenhua;  Liu Siming   |  收藏  |  浏览/下载：11/0  |  提交时间：2021/02/02 photo luminescence  Al2O3  thin films  magnetron sputtering  rare earth   Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者:  Yang H.;  Liu L.;  Liu L. 收藏  |  浏览/下载：28/0  |  提交时间：2013/03/25 Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.