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CAS IR Grid
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长春光学精密机械与物... [1]
高能物理研究所 [1]
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OAI收割 [2]
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会议论文 [1]
期刊论文 [1]
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2015 [1]
2011 [1]
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Laser wire scanner system for Beijing Electron-Positron Collider II
期刊论文
OAI收割
HIGH POWER LASER AND PARTICLE BEAMS, 2015, 卷号: 27, 期号: 6, 页码: 65103
作者:
He J(何俊)
;
Zhang C(张丛)
;
Deng QY(邓庆勇)
;
Wang L(汪林)
;
Sui YF(随艳峰)
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浏览/下载:27/0
  |  
提交时间:2016/04/18
Beam profile measurements
Beijing electron positron collider II
Cherenkov Detectors
GEANT4
Laser optical systems
Laser wires
Mathematical processing
Mechanical scanning systems
Fabrication of high-efficiency ultraviolet blazed gratings by use of direct Ar2-CHF3 ion-beam etching through a rectangular photoresist mask (EI CONFERENCE)
会议论文
OAI收割
International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, May 24, 2011 - May 26, 2011, Beijing, China
Tan X.
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浏览/下载:25/0
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提交时间:2013/03/25
In ultraviolet spectroscopy
groove irregularity and surface roughness of nanometer magnitude can cause a significant loss of diffraction efficiency. Therefore
there is a constant need to improve the diffraction efficiency. A blazed grating can concentrate most of the light intensity into a desired diffraction order
it is important to control the groove shape precisely
so it is the optimum choice among gratings of different kinds of profile. As the operating wavelength of most UV spectral applications is less than 200 nm
especially the blaze angle and the apical angle. We have presented a direct shaping method to fabricate EUV blazed gratings by using an ion-beam mixture of Ar+ and CHF2 +to etch K9 glass with a rectangular photoresist mask. With this method
the required blaze angle is small
we have succeeded in fabricating well-shaped UV blazed gratings with a 1200 line/mm groove density and 8.54 blaze angles and 1200 line/mm groove density and 11.68 blaze angles
and the metrical efficiency is about 81% and 78%. The good performance of the gratings was verified by diffraction efficiency measurements. When one uses the etching model
the conditions on the ion-beam grazing incident angle and the CHF3partial pressure should be noted. Besides
since the etched groove shape depends on the aspect ratio of the photoresist mask ridge
if we wish to fabricate larger gratings with this method
we must improve the uniformity of the photoresist mask before ion-beam etching. 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).