机构

• 长春光学精密机械与物... [1]
• 西双版纳热带植物园 [1]
• 武汉岩土力学研究所 [1]
• 沈阳自动化研究所 [1]

采集方式

• OAI收割 [4]

内容类型

• 期刊论文 [3]
• 会议论文 [1]

发表日期

• 2021 [1]
• 2012 [2]
• 2011 [1]

学科主题

筛选

浏览/检索结果: 共4条，第1-4条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 A new cross-platform instrument for microstructure turbulence measurements 期刊论文  OAI收割 Journal of Marine Science and Engineering, 2021, 卷号: 9, 期号: 10, 页码: 1-14 作者:  Nie YL(乜云利);  Yang H(杨华);  Song DL(宋大雷);  Huang Y(黄琰);  Liu, Xiuyan   |  收藏  |  浏览/下载：58/0  |  提交时间：2021/10/17 AUV  Comparative test  Cross-platform instrument  Microstructure measurements  Ocean turbulence   Leaf element concentrations of terrestrial plants across China are influenced by taxonomy and the environment 期刊论文  OAI收割 GLOBAL ECOLOGY AND BIOGEOGRAPHY, 2012, 卷号: 21, 期号: 8, 页码: 809-818 作者:  Zhang, JL 收藏  |  浏览/下载：238/0  |  提交时间：2012/10/15 Biogeography  China  climate  latitudinal gradient  leaf element  Mantel test  phylogenetically comparative method  taxonomy   A Comparative Study on the Shear Behavior of an Interlayer Material Based on Laboratory and In Situ Shear Tests 期刊论文  OAI收割 GEOTECHNICAL TESTING JOURNAL, 2012, 卷号: 35, 期号: 3, 页码: 375-386 作者:  Jiang, Ya-Li;  Huang, Ke;  Xu, Ding-Ping;  Feng, Xia-Ting;  Cui, Yu-Jun   |  收藏  |  浏览/下载：22/0  |  提交时间：2018/06/05 Baihetan site  interlayer staggered zone  laboratory shear test  in situ shear test  shear behavior  comparative study   Information extraction from laser speckle patterns using wavelet entropy techniques (EI CONFERENCE) 会议论文  OAI收割 MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, November 4, 2011 - November 6, 2011, Guilin, China 作者:  Li X.-Z.;  Wang X.-J. 收藏  |  浏览/下载：37/0  |  提交时间：2013/03/25 A novel speckle patterns processing method is presented using multi-scale wavelet techniques. Laser speckle patterns generated from the sample contained abundant information. In this paper  we propose a method using wavelet entropy techniques to analyze the speckle patterns and exact the information on the sample surface. In our case  we used this approach to test the solar silicon cell surface profiles based on the sym8 orthogonal wavelet family. According different wavelet entropy values  the micro-structure of different solar silicon cell surfaces were comparative analyzed. Furthermore  we studied the AFM and reflective spectra of the wafer. Results show that the wavelet entropy speckle processing method is effective and accurate. And the experiment proved that this method is a useful tool to investigate the surface profile quality. 2011 SPIE.