机构

• 光电技术研究所 [2]
• 长春光学精密机械与物... [1]
• 沈阳自动化研究所 [1]
• 兰州化学物理研究所 [1]

采集方式

• OAI收割 [5]

内容类型

• 期刊论文 [4]
• 会议论文 [1]

发表日期

• 2024 [1]
• 2018 [1]
• 2012 [1]
• 2008 [1]
• 2005 [1]

学科主题

筛选

浏览/检索结果: 共5条，第1-5条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Enhancing the Triboelectric Charges and Manipulating the Resistance of a Te Thin Film 期刊论文  OAI收割 ACS Applied Nano Materials, 2024, 卷号: 7, 期号: 7, 页码: 8035–8043 作者:  Zhao YK(赵永康);  Yu TT(于童童);  Wu ZS(武子帅);  Du ZH(杜长合);  Wang WQ(王雯祺)   |  收藏  |  浏览/下载：4/0  |  提交时间：2024/12/23 Te Thin Film  Contact Electrification  Atomic Force Microscopy  Kelvin Probe Force Microscopy   Plasmonic direct writing lithography with a macroscopical contact probe 期刊论文  OAI收割 APPLIED SURFACE SCIENCE, 2018, 卷号: 441, 页码: 99-104 作者:  Huang, Yuerong;  Liu, Ling;  Wang, Changtao;  Chen, Weidong;  Liu, Yunyue   |  收藏  |  浏览/下载：33/0  |  提交时间：2019/08/23 Nanolithography  Surface plasmons  Nanostructure  Contact probe   Thermal Analysis of a New Type Langmuir Probe Based on Numerical Simulation and Experimental Studies 期刊论文  OAI收割 JOURNAL OF FUSION ENERGY, 2012, 卷号: 31, 期号: 1, 页码: 79-83 作者:  Wang, Tao;  Yao, Lieming;  Zhou, Yong;  Yan, Shengmei 收藏  |  浏览/下载：31/0  |  提交时间：2015/07/10 Heat flux  Thermal state  Thermal contact resistance  Langmuir Probe (LP)  Temperature difference   The Design and Implementation of a Noncontact Laser Measurement System 期刊论文  OAI收割 微计算机信息, 2008, 卷号: 24, 期号: 22, 页码: 7-9,162 作者:  Zhang N(张妮);  Zhang YW(张云文);  Liu WJ(刘伟军);  Pu XY(普雄鹰)   |  收藏  |  浏览/下载：26/0  |  提交时间：2012/05/29 Reverse Engineering  Non-contact Measurement  Laser Probe Measurement   Optoelectronic non-contact measuring method for the taper of a bore (EI CONFERENCE) 会议论文  OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China 作者:  Zhang G.;  Zhang G.;  Zhang G.;  Yang L.;  Yang L. 收藏  |  浏览/下载：36/0  |  提交时间：2013/03/25 Based on laser optical triangulation displacement and grating displacement inspecting principle  optoelectronic non-contact inspecting method and inspecting system for the taper of small-calibre bore are presented. In this paper  the constitute and overall structure of the system are described. Then  the taper inspecting method and principle of the bore are discussed and theoretically analyzed  and also  the corresponding mathematics model is established. As inner diameter measurement is an important parameter for the taper of small-bore  an inner diameter laser non-contact measuring method is presented based on the structure characteristic of the taper of small-calibre bore  which adopted optoelectronic probe sensitive device (PSD) and laser optical triangulation inspecting principle. And then  the laser probe inner diameter measuring system is designed based them. Moreover  the measuring principle  the project of optical system of this measuring system are illuminated in detail in this article. The accuracy of inspecting system is verified by experiment. The results showed that the measuring error of inspecting system is superior to 0.005  and the inspecting repetition is superior to 0.003. It indicates that the system can fulfill the inspecting accuracy demand for inspecting the taper of the small-calibre bore  and the inspecting method is applicable.