中国科学院机构知识库网格系统: 检索

浏览/检索结果: 共5条，第1-5条

帮助

条数/页：排序方式：
	Path Delay Test generation Toward Activation of worst Case Coupling Effects 期刊论文 OAI收割 IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982 作者: minjin, zhang; Huawei, Li; Xiaowei,Li \| 收藏 \| 浏览/下载：20/0 \| 提交时间：2017/09/19 Crosstalk-induced Delay Delay Testing Path Delay Fault Signal Integrity Test Generation Timing Analysis
	Path Delay Test Generation Toward Activation of Worst Case Coupling Effects 期刊论文 OAI收割 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982 作者: Zhang, Minjin; Li, Huawei; Li, Xiaowei \| 收藏 \| 浏览/下载：19/0 \| 提交时间：2019/12/16 Crosstalk-induced delay delay testing path delay fault signal integrity test generation timing analysis
	Bat: performance-driven crosstalk mitigation based on bus-grouping asynchronous transmission 期刊论文 iSwitch采集 Ieice transactions on electronics, 2008, 卷号: E91c, 期号: 10, 页码: 1690-1697 作者: Yan, Guihai; Han, Yinhe; Li, Xiaowei; Liu, Hui 收藏 \| 浏览/下载：21/0 \| 提交时间：2019/05/10 Crosstalk delay On-chip buses Bus-grouping transmission Asynchronous Shielding
	BAT: Performance-Driven Crosstalk Mitigation Based on Bus-Grouping Asynchronous Transmission 期刊论文 OAI收割 IEICE TRANSACTIONS ON ELECTRONICS, 2008, 卷号: E91C, 期号: 10, 页码: 1690-1697 作者: Yan, Guihai; Han, Yinhe; Li, Xiaowei; Liu, Hui \| 收藏 \| 浏览/下载：14/0 \| 提交时间：2019/12/16 crosstalk delay on-chip buses bus-grouping transmission asynchronous shielding
	Selection of crosstalk-induced faults in enhanced delay test 期刊论文 OAI收割 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2005, 卷号: 21, 期号: 2, 页码: 181-195 作者: Li, HW; Li, XW \| 收藏 \| 浏览/下载：11/0 \| 提交时间：2019/12/16 delay test crosstalk automatic test pattern generation (ATPG) critical paths