机构

• 高能物理研究所 [4]
• 长春光学精密机械与物... [1]
• 新疆理化技术研究所 [1]

采集方式

• OAI收割 [6]

内容类型

• 期刊论文 [5]
• 会议论文 [1]

发表日期

• 2017 [1]
• 2015 [1]
• 2011 [2]
• 2010 [1]
• 1998 [1]

学科主题

• Physics [2]

筛选

浏览/检索结果: 共6条，第1-6条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序 Analysis of proton and gamma-ray radiation effects on CMOS active pixel sensors 期刊论文  OAI收割 CHINESE PHYSICS B, 2017, 卷号: 26, 期号: 11, 页码: 1-5 作者:     |  收藏  |  浏览/下载：45/0  |  提交时间：2018/01/08 Complementary Metal-oxide-semiconductor (Cmos) Active Pixel Sensor  Dark Current  Fixed-pattern Noise  Quantum Efficiency   Development and performance evaluation of read-out electronics system for high resolution X-ray detector 期刊论文  OAI收割 ATOMIC ENERGY SCIENCE AND TECHNOLOGY, 2015, 卷号: 49, 期号: 3, 页码: 534-539 作者:  Zhang HK(张红凯);  Feng ZD(冯召东);  Li XH(李晓辉);  Wei SJ(魏书军);  Liu SQ(刘双全) 收藏  |  浏览/下载：25/0  |  提交时间：2016/04/18 Cooling temperature  Dark current noise  Digital signal-processing circuits  Electronics system  Front-end processing  Readout Electronics  Spatial resolution  X-ray detector   Comparative studies of silicon photomultipliers and traditional vacuum photomultiplier tubes 期刊论文  OAI收割 CHINESE PHYSICS C, 2011, 卷号: 35, 期号: 1, 页码: #REF! 作者:  Shi F(石峰);  Lv JG(吕军光) 收藏  |  浏览/下载：50/0  |  提交时间：2016/04/11 silicon photomultiplier  SiPM  PMT  dark current  dark counts  excess noise factor   Comparative studies of silicon photomultipliers and traditional vacuum photomultiplier tubes 期刊论文  OAI收割 中国物理C, 中国物理C, 2011, 2011, 期号: 1, 页码: 50-55, 50-55 作者:  Shi F(石峰);  Lv JG(吕军光);  Lu H(卢红);  Wang HY(王焕玉);  Ma YQ(马宇倩)   |  收藏  |  浏览/下载：40/0  |  提交时间：2015/12/15 silicon photomultiplier  SiPM  PMT  dark current  dark counts  excess noise factor  silicon photomultiplier  SiPM  PMT  dark current  dark counts  excess noise factor   Noise processing technology of a TDICCD sensor (EI CONFERENCE) 会议论文  OAI收割 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China 作者:  Zhang L.-P. 收藏  |  浏览/下载：21/0  |  提交时间：2013/03/25 In the application of TDI-CCD  the other is all kinds of interference noise produced in the working process of a TDI-CCD  for reset noise  because of its serious noise interference  such as reset noise and 1 / f noise  correlated double sampling is employed. The experimental results show that after noise processing  the imaging quality is reduced  etc. According to the features of noise  the output S/N has been raised to about 50 dB. 2010 IEEE.  so that it is necessary to study the noise characteristics of TDI-CCD. There are two categories of noise  this paper has studied the corresponding noise-processing technology. For dark current noise  one is the inherent noise  refrigeration is taken  including shot noise  dark current noise  fixed pattern noise and transfer noise etc.   Study of the unusual performances of one type drift chamber feedthrough 期刊论文  OAI收割 HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION, 1998, 卷号: 22, 期号: 5, 页码: 398-405 作者:  Wang YY(王运永);  Wang SM(王少敏);  Mao HS(毛慧顺);  Liu RG(刘荣光);  Li RB(李如柏) 收藏  |  浏览/下载：40/0  |  提交时间：2016/06/28 drift chamber  feedthrough  aging effect  dark current  random noise  high voltage  temperature