机构

• 计算技术研究所 [4]
• 过程工程研究所 [2]
• 中国科学院大学 [1]
• 软件研究所 [1]

采集方式

• OAI收割 [7]
• iSwitch采集 [1]

内容类型

• 期刊论文 [7]
• 会议论文 [1]

发表日期

• 2022 [2]
• 2016 [1]
• 2011 [1]
• 2008 [3]
• 2007 [1]

学科主题

• Density Fu... [1]
• Perovskite... [1]

筛选

浏览/检索结果: 共8条，第1-8条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Hydrogen bonds in aqueous choline chloride solutions by DFT calculations and X-ray scattering 期刊论文  OAI收割 Journal of Molecular Liquids, 2022, 卷号: 362 作者:  Chai, Keke;  Lu, Xingmei;  Zhou, Yongquan;  Liu, Hongyan;  Wang, Guangguo   |  收藏  |  浏览/下载：0/0  |  提交时间：2023/06/26 Carbon - Chlorine compounds - Design for testability - Distribution functions - Hydrogen bonds - Mixtures - Physicochemical properties - X ray scattering   Probing the effect of acceptor engineering in benzothiadiazole-based D-A-D-typed hole-transporting materials for perovskite solar cells 期刊论文  OAI收割 Synthetic Metals, 2022, 卷号: 289 作者:  Sun, Zhu-Zhu;  Feng, Shuai;  Ding, Wei-Lu;  Yang, Jie;  Zhu, Xiao-Rui   |  收藏  |  浏览/下载：0/0  |  提交时间：2023/06/26 Cell engineering - Design for testability - Hole mobility - Optical properties - Perovskite   On-Chip Generating FPGA Test Configuration Bitstreams to Reduce Manufacturing Test Time 期刊论文  OAI收割 CHINESE JOURNAL OF ELECTRONICS, 2016, 卷号: 25, 期号: 1, 页码: 64-70 作者:  Wang Fei;  Wang Da   |  收藏  |  浏览/下载：33/0  |  提交时间：2019/12/13 FPGA test  Test configuration bitstream  Design-for-testability   Design for Testability Features of Godson-3 Multicore Microprocessor 期刊论文  OAI收割 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2011, 卷号: 26, 期号: 2, 页码: 302-313 作者:  Qi, Zi-Chu;  Liu, Hui;  Li, Xiang-Ku;  Hu, Wei-Wu   |  收藏  |  浏览/下载：27/0  |  提交时间：2019/12/16 DFT (design for testability)  TAM (test access mechanism)  multicore processor  low power test   Design-for-testability features and test implementation of a giga hertz general purpose microprocessor 期刊论文  iSwitch采集 Journal of computer science and technology, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者:  Wang, Da;  Hu, Yu;  Li, Hua-Wei;  Li, Xiao-Wei 收藏  |  浏览/下载：21/0  |  提交时间：2019/05/10 Microprocessor design-for-testability  Test generation  Built-in self-test  At-speed testing   Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文  OAI收割 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者:  Wang, Da;  Hu, Yu;  Li, Hua-Wei;  Li, Xiao-Wei   |  收藏  |  浏览/下载：17/0  |  提交时间：2019/12/16 microprocessor design-for-testability  test generation  built-in self-test  at-speed testing   Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文  OAI收割 Journal of Computer Science and Technology, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者:  Da Wang(王 达);  Yu Hu(胡 瑜);  Hua-Wei Li(李华伟);  Xiao-Wei Li(李晓维)   |  收藏  |  浏览/下载：20/0  |  提交时间：2010/11/02 Microprocessor Design-for-testability  Test Generation  Built-in Self-test  At-speed Testing   automated large-scale simulation test-data generation for object-oriented software systems 会议论文  OAI收割 1st International Symposium on Data, Privacy and E-Commerce (ISDPE 2007), Chengdu, PEOPLES R CHINA, NOV 01-03, Zheng Yujun; Ma Yan; Xue Jinyan   |  收藏  |  浏览/下载：19/0  |  提交时间：2011/06/29 Automation  Commerce  Design for testability  Electronic commerce  Information systems  Life cycle  Object oriented programming  Software design  Software engineering  Statistical methods  Statistical tests  Testing