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	Displacement Analysis of Solar Magnetic Field Images in EUV Wavelengths of Space Solar Telescope 期刊论文 OAI收割 International Journal of Pattern Recognition and Artificial Intelligence, 2019, 卷号: 33, 期号: 3, 页码: 24 作者: Y.Liu; K.F.Song; X.D.Wang; B.Chen; J.L.Ma \| 收藏 \| 浏览/下载：41/0 \| 提交时间：2020/08/24 Solar magnetic field images,displacement analysis,EUV,nonlinear,gradient iteration,mean error,parabolic least-square fit algorithm,Computer Science
	Nanoscale patterns made by using a 13.5-nm Schwarzschild objective and a laser produced plasma source (EI CONFERENCE) 会议论文 OAI收割 Optical Micro- and Nanometrology IV, April 16, 2012 - April 18, 2012, Brussels, Belgium 作者: Wang X.; Wang X.; Wang X.; Wang Z.; Wang Z. 收藏 \| 浏览/下载：37/0 \| 提交时间：2013/03/25 Lithium fluoride (LiF) crystal is a very promising candidate as nanometer resolution EUV and soft X-ray detector. Compared with other EUV and soft X-ray detectors charge coupled device and photographic films LiF crystal has high resolution large field of view and wide dynamic range. In this paper using LiF crystal as EUV detector and a Schwarzschild objective (SO) working at 13.5nm as projection optics mesh images with 4.2 m 1.2 m and 800 nm line width and pinhole patterns with 1.5m diameter are acquired in projection imaging mode and direct writing mode respectively. Fluorescence intensity profiles of images show that the resolution of mesh image is 900 nm and the one of pinhole image is 800 nm. In the experiments a spherical condense mirror based on normal incidence type is used to eliminate the damage and contamination on the masks (mesh and pinhole) caused by the laser plasma and the energy density is not decreased compared with that the masks are close to the plasma. The development of the SO the alignment of the objective and the imaging experiments are also reported. 2012 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).
	Resolution performance of extreme ultraviolet telescope (EI CONFERENCE) 会议论文 OAI收割 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008, Chengdu, China 作者: Yang L.; Chen B.; Chen B.; Liang J.-Q.; Ni Q.-L. 收藏 \| 浏览/下载：30/0 \| 提交时间：2013/03/25 Extreme Ultraviolet Telescope (EUT) will image solar corona in four EUV narrow bandpasses defined by multilayered coatings deposited on normal incidence optics. In order to make sure it will get sub-arcsecond angular resolution in the mission we have to test its resolution performance on ground. The EUT is aligned by Zygo interferometer first and a global wavefront error of 0.152 peak to valley is obtained ( = 632.8nm ). Because of the difficulty of angular resolution test for EUT at its operating wavelengths we test its optical performance at visible and UV band. The method is to place the resolution test-target on the focal plane of collimator and illuminate the target by visible and UV light espectively then the collimated light will go through EUT and image at focal plane on CCD. By analysis of the images obtained in experiments we conclude that the angular resolution of EUT is 1.22 at visible light ( = 570nm ) which is very close to diffraction limit (1.20) and according to these results we estimate that the operational wavelength resolution is better than 0.32 meets design requirements. While for UV light the angular resolution is 1.53 that is different from diffraction limit (0.53) the error comes mainly from large pixel of EUV camera. 2009 SPIE.
	Segmentation of loops from coronal EUV images 期刊论文 OAI收割 SOLAR PHYSICS, 2008, 卷号: 248, 期号: 2, 页码: 379-393 作者: Inhester, B.; Feng, L.; Wiegelmann, T. 收藏 \| 浏览/下载：17/0 \| 提交时间：2011/12/29 EUV images coronal magnetic fields image processing