中国科学院机构知识库网格
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Modulation for focusing properties of vector beams in imaging systems 期刊论文  OAI收割
opt. commun., 2014, 卷号: 311, 页码: 117
作者:  
Weng, Xiaoyu;  Guo, Hanming;  Sui, Guorong;  Hu, Qi;  Zheng, Jihong
收藏  |  浏览/下载:26/0  |  提交时间:2016/11/28
Modulation for focusing properties of vector beams in imaging systems 期刊论文  OAI收割
opt. commun., 2014, 卷号: 311, 页码: 117
作者:  
Weng, Xiaoyu;  Guo, Hanming;  Sui, Guorong;  Hu, Qi;  Zheng, Jihong
收藏  |  浏览/下载:24/0  |  提交时间:2016/11/28
Use of fractal zone plates for transmission X-ray microscopy 期刊论文  OAI收割
ANALYTICAL AND BIOANALYTICAL CHEMISTRY, 2012, 卷号: 404, 期号: 5, 页码: 1303-1309
作者:  
Ge, X;  Wang, ZL;  Gao, K;  Wang, DJ;  Wu, Z
收藏  |  浏览/下载:20/0  |  提交时间:2016/04/08
IAD-Si coatings on RB-SiC space mirrors for ultra-smooth surfaces (EI CONFERENCE) 会议论文  OAI收割
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, November 19, 2008 - November 21, 2008, Chengdu, China
作者:  
Xu L.;  Wang X.;  Wang X.;  Wang X.;  Zhang F.
收藏  |  浏览/下载:25/0  |  提交时间:2013/03/25
To eliminate surface limitation caused by Silicon impurity in RB-SiC space mirrors  a relatively thick Si film is deposited on well finished RB-SiC substrate by a new process-ion assisted depositing (IAD) to provide a better polishable surface. Testing results of IAD-Si properties are provided  showing that the amorphous film has great thermal shock resistance. Then  polishing experiments on 100.5m thick IAD-Si layers are accomplished focusing on smoother surface. Surface figure and micro-roughness of the coating after polished reach 0.026 RMS (=0.6328nm) and less than 0.5nm RMS respectively. Moreover  reflectivity of IAD-Si polished surface with reflective films increases higher than 4.5% than that of RB-SiC in 360-1100nm. High reflectivity and desirable thermal property make IAD-Si an attractive coating material for RB-SiC space mirrors. 2009 SPIE.  
High-power VCSELs single devices aid 2-D arrays (EI CONFERENCE) 会议论文  OAI收割
ICO20: Lasers and Laser Technologies, August 21, 2005 - August 26, 2005, Changchun, China
作者:  
Liu Y.;  Wang L.;  Wang L.;  Wang L.;  Liu Y.
收藏  |  浏览/下载:14/0  |  提交时间:2013/03/25